Scanning probe microscopy artifacts

Howland, Rebecca, and Lisa Benatar. A Practical Guide to Scanning Probe Microscopy. ThermoMi-croscopes. March 2000. Web. Accessed September, 2011. This introductory guide to scanning probe microscopy describes several techniques and operating modes of the devices, as well as their structure and principles of operation, and discusses the occurrence of ims e artifacts in their use. 

On the basis of our results using scanning force microscopy such as S VM and LFM, we claim that the mobility at the surface of PS films is not the same as that in the bulk. However, in such measurements, a probe tip made of silicon or silicon nitride makes contact with the surface to be measured. This may induce some artifacts in the results. If an effect of tip contact on the surface dynamics cannot be negligible, our conclusion must be reconsidered. Thus, T is here discussed on the basis of coarse-grained molecular dynamics simulation using a bead-spring model of Grest... 

Scanning ion conductance microscopy, like other SPM techniques, has complex resolution considerations. Resolution is dependent upon probe-surface interaction, as well as probe geometry and probe-surface distance. Image convolutions and artifacts occur as a result of interactions between ion current distribution of the pipette tip and the sample surface. Various models have been proposed to elucidate this behavior. 

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