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Scanning electron microscopy, carbon

The major gaseous components were analyzed by a gas chromatograph equipped with a TCD and a molecular sieve 13X column. The specific surface areas of carbon produced were measured by the BET method(ASAP 2010, Micromeritics). The morphology and particle size of the formed carbon were investigated by the scanning electron microscopy(S-4200, Hitachi... [Pg.421]

Figure 3. Images of a cross-section of carbon fibers after propylene pyrolysis. 3a Scanning Electron Microscopy of a piece of the carbon cloth. 3b optical microscopy (crossed polarizers with a wave retarding plate). Figure 3. Images of a cross-section of carbon fibers after propylene pyrolysis. 3a Scanning Electron Microscopy of a piece of the carbon cloth. 3b optical microscopy (crossed polarizers with a wave retarding plate).
This investigation relied on petrographic analysis of polished sections using reflected light and the scanning electron microscopy (SEM) and electron microprobe (EPMA) analyses to identify minerals and to document the distribution of gold. The mineralized zone is coincident with a distinct bleached alteration zone that contains fine- to coarse-grained, subhedral arsenopyrite and pyrite in quartz-carbonate veins. [Pg.210]

Fig. 3.4. The highest resolution ever achieved by acoustic microscopy, using pressurized superfluid helium (at 0.4 K and 2.14 MPa, at 15.4 GHz) compared with scanning electron microscopy of the same specimens coated with 10 nm carbon, at 5 keV. (a) Acoustic and (b) s.e.m. pictures of a 200 nm period titanium grating on a silicon substrate (c) acoustic and (d) s.e.m. pictures of an array of 1 [im diameter holes with 2 pm spacing in a thin film of chromium on glass (Muha et al. 1990). Fig. 3.4. The highest resolution ever achieved by acoustic microscopy, using pressurized superfluid helium (at 0.4 K and 2.14 MPa, at 15.4 GHz) compared with scanning electron microscopy of the same specimens coated with 10 nm carbon, at 5 keV. (a) Acoustic and (b) s.e.m. pictures of a 200 nm period titanium grating on a silicon substrate (c) acoustic and (d) s.e.m. pictures of an array of 1 [im diameter holes with 2 pm spacing in a thin film of chromium on glass (Muha et al. 1990).
FIG. 1.13 Spherical and cubic model particles with crystalline or amorphous microstructure (a) spherical zinc sulfide particles (transmission electron microscopy, TEM, see Section 1.6a.2a) x-ray diffraction studies show that the microstructure of these particles is crystalline (b) cubic lead sulfide particles (scanning electron microscopy, SEM, see Section 1.6a.2a) (c) amorphous spherical particles of manganese (II) phosphate (TEM) and (d) crystalline cubic cadmium carbonate particles (SEM). (Reprinted with permission of Matijevic 1993.)... [Pg.24]

Note These specifications were developed at Balazs Analytical Laboratory. Abbreviations are defined as follows DRAM, dynamic random access memory VLSI, very-large-scale integration ULSI, ultralarge-scale integration TOC, total oxidizable carbon THM, trihalomethane SEM, scanning electron microscopy and EPI, epifluorescence... [Pg.523]


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