Scanning Auger micrograph

Fig. 4. Scanning electron micrograph of 5-p.m diameter Zn powder. Neck formation from localized melting is caused by high-velocity interparticle coUisions. Similar micrographs and elemental composition maps (by Auger electron spectroscopy) of mixed metal coUisions have also been made.

Auger specimens 10 x 2 x 1 mm were heat-treated and then notched to control the location of fracture. Two of these notched samples at a time were loaded into specimen grips such that they could be broken independently under UHV and then examined by a SAM instrument. Scanning electron micrographs allowed different grain boundaries and transgranular cleavage areas to be selected for analysis. 

Fig. 31. Scanning electron micrograph (SEM) and scanning Auger element maps for an array of four strips of gold numbers 1,3,6, and 8) and four of aluminum/alumina (numbers 2, 4, 5, and 7) on a silicon nitride substrate that was exposed to a mixture of HS(CH2),, C1 and CF3(CF2)8C02H in isooctane. The SEM and element maps are for the array viewed from above the schematic of the device (the height of the strips is not drawn to scale) is a side view [175]...

Fig. 6. Patterning of polythiophene growth on silicon (a) scanning Auger image (with representative line scan) of sulphur on a patterned thienyl terminated surface made via the photooxidation patterning approach discussed in the text, (b) schematic of photoelec-trochemical polymerization on patterned surface and (c) optical micrograph of surface after polymerization to grow 50 nm polythiophene film. Adapted from [52],...

Fig. 14. Scanning Auger electron micrograph of a pattern in a-Si H previously irradiated by an interrupted scanning electron beam. [After Schade and Hockings (1983).]...

Fig. 2. Secondary electron image and a series of scanning auger images taken from a steel substrate treated with an aminosilane from which the nylon coating has disbonded during a salt spray test. Width of micrographs is 85 qm. (Courtesy of Marianne Guichenuy, University of Surrey)...

FIGURE 14.1.17 Scanning electron micrograph and energy-dispersive X-ray microanalysis (a) and profile of Auger electron spectroscopy (b) of the cross-section of apatite formed on the NaOH- and heat-treated titanium metal in SBF. 

Electron beams can be focused to small diameters so AES can be used to identify the atomic content of very small (submicron) particles as well as extended surfaces. The secondary electrons emitted by the probing electron bombardment can be used to visualize the surface in the same maimer as scanning electron microscopy (SEM). Thus, the probing beam can be scanned over the surface to give an SEM micrograph of the surface and also an Auger compositional analysis of the surface. 

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