Scanned Probe Microscopy rastering

Table 12.5 Scanning probe microscopy Raster analysis...

Since the pioneering work of Binnig157 in the 1980s, the family of microscopic techniques collectively known as scanned probe microscopy (or SPM) has become widely available and is extensively used in conducting polymer research. SPM consists of a number of related techniques in which a fine probe is rastered across a sample surface. Interaction between the probe tip and the sample drives a feedback system that allows topographical mapping of the sample surface. Scanning tunnel-... 

Scanning electrochemical microscopy (SECM) is a scanning probe technique that provides a local chemical interrogation of an interface. In a typical experimental setup (Figure 8.1), the probe, also named the tip, is an ultramicroelectrode (UME), a microelectrode of radius <25 pm, which is rastered with micropositioners in the vicinity of an interface in order to detect an elec-trochemically active species. Contrary to other scanning probe microscopies. 

In scanning electron microscopy (SEM), a finely focussed electron beam probe moves from one point on the specimen to the next to form a raster pattern, just as in television imaging. The intensity of scattered or secondary electrons is continuously... 

Scanning electrochemical microscopy (SECM, see Chapter 12) is another microelectrode technique that has been used at the cellular surface. Briefly, with SECM a microelectrode (UME, see Chapter 6) functions as a scanning probe that detects local electrochanical activity. When the UME is rastered over a sample, electrochemical data is recorded at multiple positions and an image is constructed based on the local electrochemical properties of the area of interest SECM has been thoroughly reviewed (19,20,52, Chapter 12 of this... 

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