Sample width

In Equation 1, S is the stress at point I in PSI, V is the raw voltage data for point I In millivolts, F is the full scale load in pounds, W is the sample width and T is the thickness in Inches, and Co, Cl, and Ch are calibration data for zero, load, and sample hanger in millivolts. 

Sample Length l.OOOin Sample Width 0.750in... 

Fig. 18b. 12. (a) Voltage-time profile for anodic stripping voltammetry (ASV) and (b) ASV of an unknown solution with two aliquot additions of 100 ppb each of Cd and Pb in the final solution. The peak at —190 mV is that of Cu present in the unknown. Experimental conditions Initial deposition potential, Ed = —800 mV, final potential = 0, deposition time, td — 120 s, quite time, tq — 30 s, step potential = 5 mV, pulse height = 20 mV, pulse delay = 100 ms, sampling width — 17 ms, and sampling frequency — 6000 Hz. 

Are the quantitative characteristics of the halos homogeneous in the same sample (width, maximum reflectivity, shape of profile) ... 

The adhesion is calculated by dividing the maximum force recorded by the sample width in millimeters. With the current bonding technology, the polyurethane will, in most circumstances, break before the sample starts to peel. This is referred to as a stock break (SB). 

Scan mode Scan speed Sampling width Scan axis Scan range 9 offset... 

SHEER MODULUS IN DYNES/CM L-SAMPLE LENGTH IN INCHES C-SAMPLE WIDTH IN INCHES D-SAMPLE THICKNESS IN INCHES I -POLAR MOMENT OF INERTIA BAR IN 6-Cm2 ... 

Figure 10.15b illustrates the influence of the width of the injection profile at constant sample size. When the sample width increases beyond a value corresponding to approximately half the natural bandwidth of the peak obtained xm-der linear conditions, the overloaded band begins to widen and becomes shorter [48,70]. For a sufficiently wide injection pulse, the elution profile has a plateau at the injection concentration. 

In this case F = (FWHM)/2.35. (For components that are better approximated with a boxcar distribution, e.g. detector and sample width, r=(FWHM)/(2>/3).)... 

According to Eqs. 3.10 and 3.13, the inlet of a confluent stream promotes a decrease in the recorded peak height, h, and an increase in sample width, a (Fig. 5.15), but these effects are only evident for systems with limited sample dispersion. In this situation, larger sample volumes are used, the saturation index approaches unity, and sample dispersion occurring after the confluence site is very low [84]. Consequently, modifications in h and a caused by confluence addition cannot be compensated downstream, and manifest themselves in the shape of the recorded peaks (see also Fig. 5.16, right). 

Figure 6. Effect of beam size and critical angle on sample size. Typical beam height at SSRL (SPEAR II) is 1 mm or so. In general this requires discarding 90% or more of the bam to achieve useful results. The situation is made worse due to high beam divergence which forces setup further below the critical angle. In the case of 3rd generation sources, practically all of the beam can be used on sample widths down to a few mm.

Fig. 2. SPV curve obtained by Dresner et a/. (1981) on a sample of a-Si H (sample D-09-04-0 with substrate temperature 240°C and sample width 2.3 fim) using a Kelvin electrostatic probe pickup. [From Dresner et al. (1981).]...

The results in Table 5.3 led to the conclusion that the fabric peel test (FPT) method is reproducible and provides lower variability as compared to the other two methods. Accordingly, this method was optimized in terms of curing time of V-200 (a PTOEO/MPC formulation) and adopted as an in-house standard test method. The peel force was recorded as the maximum load-to-fail in N for a sample width of 1 m. During optimization, a 15-min cure time was selected on the basis of data in Table 5.4. Typical results on absorbable and nonabsorbable formulations using the optimized FPT are summarized in Table 5.5. The peel force was recorded as the maximum load-to-fail in N, normalized to a sample width of 2.5 cm. 

Maximum load-to-fail normalized for 2.5-cm sample width. 

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