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SAM images

Formation of nanopores are directly observed by scanning Auger microscopy (SAM) data for that surface region [5]. From SEM and SAM images taken from same area, after SiN nanonetwork deposition, nanometer scale pores without Si were observed, and the area between GaN islands was indeed covered by SiN. Meanwhile, the density of nanopores was probably much larger than nucleation density. [Pg.125]

Figure 7. Single conjugated rod-like molecule isolated in a alkanethiolate SAM imaged by conductance between the STM tip and the Au through the conjugated molecule. Figure 7. Single conjugated rod-like molecule isolated in a alkanethiolate SAM imaged by conductance between the STM tip and the Au through the conjugated molecule.
C-SAM image showing die attach voids. (From Sonoscan, Product Literature, http // www.sonoscan.com, accessed September 26, 2003. V Sth permission.)... [Pg.155]

Figure 5. SAM images of the native oxide film on the silicon wafer was observed by using, (a) LW spectrum of silicon oxide, (b) LW spectrum of silicon, (c) 0-KLL and (d) C-KLL respectively. Figure 5. SAM images of the native oxide film on the silicon wafer was observed by using, (a) LW spectrum of silicon oxide, (b) LW spectrum of silicon, (c) 0-KLL and (d) C-KLL respectively.
ToF-SIMS was decisive in solving the crater problem because it gave organic information about the various species present and because its sensitivity was sufficient to detect submonolayer coverages of the lubricant at the crater bottom. The lubricant concentration was so low that neither EPMA nor SAM, imaging techniques normally applied to these kinds of problems, was able to detect the fluorine in the crater. [Pg.241]

The effects of surface contamination are shown in Fig. 37, in which the O SAM image recorded from a triangle in the as-deposited condition is shown. [Pg.527]

Figure 35, SAM images obtained from the lnP/Si02 sample for (a) In and (b) O. Both images have been recorded after correction by the [peak-background]A>ackground procedure. The light field is associated with high abundance, and the dark field with low abundance. Figure 35, SAM images obtained from the lnP/Si02 sample for (a) In and (b) O. Both images have been recorded after correction by the [peak-background]A>ackground procedure. The light field is associated with high abundance, and the dark field with low abundance.
Figure 37. SAM image for oxygen ([peak-backgroundl/background) recorded from an area containing a silica triangle on the InP/Si02 sample, analyzed in the as-deposited condition. Figure 37. SAM image for oxygen ([peak-backgroundl/background) recorded from an area containing a silica triangle on the InP/Si02 sample, analyzed in the as-deposited condition.
Figure 41. SAM and scanning ELS images recorded from the neighborhood of the curl-shaped feature (marked in Fig. 40c) (a) SAM image for P (b) SAM image for C (c) scanning ELS image for InP. Figure 41. SAM and scanning ELS images recorded from the neighborhood of the curl-shaped feature (marked in Fig. 40c) (a) SAM image for P (b) SAM image for C (c) scanning ELS image for InP.
Both point spectra and elemental imaging in SAM were able to provide much information about elemental, chemical, and compositional inhomo-geneities across the surface of the pipe. Thus the SAM images of Fig. 12 re-... [Pg.855]

This is the first study that combines SAXS, SR-pCT and SAM imaging in order elucidate the impact of mineral platelets orientation and mean thickness on microelasticity. The alternating pattern of high and low impedance values across a human osteon was found in spite of a homogeneous... [Pg.192]


See other pages where SAM images is mentioned: [Pg.146]    [Pg.338]    [Pg.65]    [Pg.569]    [Pg.570]    [Pg.411]    [Pg.493]    [Pg.494]    [Pg.571]    [Pg.492]    [Pg.100]    [Pg.50]    [Pg.51]    [Pg.396]    [Pg.396]    [Pg.520]    [Pg.522]    [Pg.526]    [Pg.527]    [Pg.527]    [Pg.529]    [Pg.533]    [Pg.534]    [Pg.535]    [Pg.535]    [Pg.632]   


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