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Resolution ideal microscopes

In many ways the nanocrystal characterization problem is an ideal one for transmission electron microscopy (TEM). Here, an electron beam is used to image a thin sample in transmission mode [119]. The resolution is a sensitive fimction of the beam voltage and electron optics a low-resolution microscope operating at 100 kV might... [Pg.2903]

Seeing the surface of a catalyst, preferably in atomic detail, is the ideal of every catalytic chemist. Unfortunately, optical microscopy is of no use for achieving this, simply because the rather long wavelength of visible light (a few hundred nanometers) does not enable features smaller than about one micrometer to be detected. Electron beams offer better opportunities. Development over the past 40 years has resulted in electron microscopes which routinely achieve magnifications on the order of one million times and reveal details with a resolution of about 0.1 nm [1], The technique has become very popular in catalysis, and several reviews offer a good overview of what electron microscopy and related techniques tell us about a catalyst 12-6],... [Pg.182]

Important advantages are gained if proteins are immobilized at the electrode surface, hence giving an electroactive film that is ideally of monolayer coverage. This approach has been termed protein film voltammetry and one of its major advantages is that microscopic quantities of the protein are required and thermodynamic and kinetic information can be obtained with higher accuracy and resolution. [Pg.158]

High-resolution transmission electron microscopy can be understood as a general information-transfer process. The incident electron wave, which for HRTEM is ideally a plane wave with its wave vector parallel to a zone axis of the crystal, is diffracted by the crystal and transferred to the exit plane of the specimen. The electron wave at the exit plane contains the structure information of the illuminated specimen area in both the phase and the amplitude.. This exit-plane wave is transferred, however affected by the objective lens, to the recording device. To describe this information transfer in the microscope, it is advantageous to work in Fourier space with the spatial frequency of the electron wave as the relevant variable. For a crystal, the frequency spectrum of the exit-plane wave is dominated by a few discrete values, which are given by the most strongly excited Bloch states, respectively, by the Bragg-diffracted beams. [Pg.3145]


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