Refraction imaginary

Figure Bl.26.13. Plot of versus K, the imaginary part of the refractive index.

Figure 7-13. (a) Linear absorption of DOO-PPV, (b) imaginary part of ) (proportional to two-photon absorption), and (c) real part ol (proportional to the nonlinear index of refraction. .). 

Imaginary part of complex principal refractive index Birefringence... 

The particle is an optically homogeneous smooth sphere whose real and imaginary refractive indices are both known. 

In order to calculate particle size distributions in the adsorption regime and also to determine the relative effects of wavelength on the extinction cross section and imaginary refractive index of the particles, a series of turbidity meas irements were made on the polystyrene standards using a variable wavelength UV detector. More detailed discussions are presented elsewhere (23) > shown here is a brief summary of some of the major results and conclusions. 

Figure 11. Imaginary part of complex refractive index for polystyrene...

Ellipsometry is used to study film growth on electrode surfaces. It is possible to study films at the partial monolayer level and all the way up to coverage of thicknesses of thousands of angstroms while doing electrochemical measnrements. To get nseful data it is important to determine A and j/ for the bare electrode snrface and the surface with a film. These data are processed to derive the film thickness, d, and the refractive index, h, which consists of a real (n) and imaginary part (k), h = n- ik. So ellipsometry gives information on the thickness and refractive index of snrface hlms. 

From Eq. (3) derive the relations for the real and imaginary parts of the refractive index as Auctions of the permittivity and the electrical conductivity of a given medium. Note drat both n and k are defined as real quantities. 

The Z-scan technique, first introduced in 1989 [64, 65], is a sensitive single-beam technique to determine the nonlinear absorption and nonlinear refraction of materials independently from their fluorescence properties. The simplicity of separating the real and imaginary parts of the nonlinearity, corresponding to nonlinear refraction and absorption processes, makes the Z-scan the most widely used technique to measure these nonlinear properties however, it does not automatically differentiate the physical processes leading to the nonlinear responses. 

The region where V > E corresponds to an imaginary index of refraction... 

---