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Reflection semiconductors

Small metal clusters are also of interest because of their importance in catalysis. Despite the fact that small clusters should consist of mostly surface atoms, measurement of the photon ionization threshold for Hg clusters suggest that a transition from van der Waals to metallic properties occurs in the range of 20-70 atoms per cluster [88] and near-bulk magnetic properties are expected for Ni, Pd, and Pt clusters of only 13 atoms [89] Theoretical calculations on Sin and other semiconductors predict that the stmcture reflects the bulk lattice for 1000 atoms but the bulk electronic wave functions are not obtained [90]. Bartell and co-workers [91] study beams of molecular clusters with electron dirfraction and molecular dynamics simulations and find new phases not observed in the bulk. Bulk models appear to be valid for their clusters of several thousand atoms (see Section IX-3). [Pg.270]

Semiconductors are poor conductors of electricity at low temperatures. Since the valence band is completely occupied, an applied electric field caimot change the total momentum of the valence electrons. This is a reflection of the Pauli principle. This would not be true for an electron that is excited into the conduction band. However, for a band gap of 1 eV or more, few electrons can be themially excited into the conduction band at ambient temperatures. Conversely, the electronic properties of semiconductors at ambient temperatures can be profoundly altered by the... [Pg.114]

Typical results for a semiconducting liquid are illustrated in figure Al.3.29 where the experunental pair correlation and structure factors for silicon are presented. The radial distribution function shows a sharp first peak followed by oscillations. The structure in the radial distribution fiinction reflects some local ordering. The nature and degree of this order depends on the chemical nature of the liquid state. For example, semiconductor liquids are especially interesting in this sense as they are believed to retain covalent bonding characteristics even in the melt. [Pg.132]

Jeon T I and Grischkowsky D 1998 Characterization of optically dense, doped semiconductors by reflection THz time domain spectroscopy Appl. Rhys. Lett. 72 3032-4... [Pg.1261]

Aktsipetrov O A, Baranova I M and Il inskii Y A 1986 Surface contribution to the generation of reflected second-harmonic light for centrosymmetric semiconductors Zh. Eksp. Tear. Fiz. 91 287-97 (Engl, transl. 1986 Sov. Phys. JETP 64 167-73)... [Pg.1302]

Figure Bl.22.4. Differential IR absorption spectra from a metal-oxide silicon field-effect transistor (MOSFET) as a fiinction of gate voltage (or inversion layer density, n, which is the parameter reported in the figure). Clear peaks are seen in these spectra for the 0-1, 0-2 and 0-3 inter-electric-field subband transitions that develop for charge carriers when confined to a narrow (<100 A) region near the oxide-semiconductor interface. The inset shows a schematic representation of the attenuated total reflection (ATR) arrangement used in these experiments. These data provide an example of the use of ATR IR spectroscopy for the probing of electronic states in semiconductor surfaces [44]-... Figure Bl.22.4. Differential IR absorption spectra from a metal-oxide silicon field-effect transistor (MOSFET) as a fiinction of gate voltage (or inversion layer density, n, which is the parameter reported in the figure). Clear peaks are seen in these spectra for the 0-1, 0-2 and 0-3 inter-electric-field subband transitions that develop for charge carriers when confined to a narrow (<100 A) region near the oxide-semiconductor interface. The inset shows a schematic representation of the attenuated total reflection (ATR) arrangement used in these experiments. These data provide an example of the use of ATR IR spectroscopy for the probing of electronic states in semiconductor surfaces [44]-...
Dielectric constants of metals, semiconductors and insulators can be detennined from ellipsometry measurements [38, 39]. Since the dielectric constant can vary depending on the way in which a fihn is grown, the measurement of accurate film thicknesses relies on having accurate values of the dielectric constant. One connnon procedure for detennining dielectric constants is by using a Kramers-Kronig analysis of spectroscopic reflectance data [39]. This method suffers from the series-tennination error as well as the difficulty of making corrections for the presence of overlayer contaminants. The ellipsometry method is for the most part free of both these sources of error and thus yields the most accurate values to date [39]. [Pg.1887]

Consumer Products. Laser-based products have emerged from the laboratories and become familiar products used by many millions of people in everyday circumstances. Examples include the supermarket scaimer, the laser printer, and the compact disk. The supermarket scanner has become a familiar fixture at the point of sale in stores. The beam from a laser is scaimed across the bar-code marking that identifies a product, and the pattern of varying reflected light intensity is detected and interpreted by a computer to identify the product. Then the information is printed on the sales sHp. The use of the scanner can speed checkout from places like supermarkets. The scanners have usually been helium—neon lasers, but visible semiconductor lasers may take an impact in this appHcation. [Pg.17]

The compact disk player has become a very widespread consumer product for audio reproduction. The information is stored along tracks on the disk in the form of spots of varying reflectivity. The laser beam is focused on a track on the surface of the disk, which is rotated under the beam. The information is recovered by detecting the variations in the reflected light. The compact disk offers very high fideHty because there is no physical contact with the disk. This appHcation has usually employed a semiconductor laser source operating at a wavelength of around 780 nm. Tens of millions of such compact disk players are produced worldwide every year. [Pg.17]

Fig. 2. Electron drift velocities as a function of electric field for A, GaAs and B, Si The gradual saturation of curve B is characteristic of all indirect semiconductors. Curve A is characteristic of direct gap semiconductors and at low electric fields this curve has a steeper slope which reflects the larger electron mobiUty. The peak in curve A is the point at which a substantial fraction of the electrons have gained sufficient energy to populate the indirect L minimum which has a much larger electron-effective mass than the F minimum. Above 30 kV/cm (not shown) the drift velocity in Si exceeds that in... Fig. 2. Electron drift velocities as a function of electric field for A, GaAs and B, Si The gradual saturation of curve B is characteristic of all indirect semiconductors. Curve A is characteristic of direct gap semiconductors and at low electric fields this curve has a steeper slope which reflects the larger electron mobiUty. The peak in curve A is the point at which a substantial fraction of the electrons have gained sufficient energy to populate the indirect L minimum which has a much larger electron-effective mass than the F minimum. Above 30 kV/cm (not shown) the drift velocity in Si exceeds that in...
Where b is Planck s constant and m and are the effective masses of the electron and hole which may be larger or smaller than the rest mass of the electron. The effective mass reflects the strength of the interaction between the electron or hole and the periodic lattice and potentials within the crystal stmcture. In an ideal covalent semiconductor, electrons in the conduction band and holes in the valence band may be considered as quasi-free particles. The carriers have high drift mobilities in the range of 10 to 10 cm /(V-s) at room temperature. As shown in Table 4, this is the case for both metallic oxides and covalent semiconductors at room temperature. [Pg.357]


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Semiconductors reflection coefficient

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