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Reflection coefficient for

The reflection coefficient depends on the peak overpressure, the angle of incidence of the wave front relative to the reflecting surface, and on the type of blast wave. The curves in Figure 3.2 shows reflection coefficients for shock waves and pressure waves, for angles of incidence varying from 0° (wave front parallel to surface) to 90° (wave front perpendicular to surface), and for peak overpressures up to about 5 times atmospheric pressure. [Pg.149]

The present study shows that the asymptotic salt rejection, r, is determined by the top skin layer of a membrane. This is a result of the steady-state mass balance and the boundary conditions. Although there are no experimental data to support this, it has been shown theoretically that the asymptotic salt rejection is identical to the reflection coefficient for the homogeneous membrane, r = 0. [Pg.264]

It is well known that the SPR may be registered as the sharp minimum of the reflection coefficient for the plane-parallel light which depends on the incidence angle. The position of the resonance angle and the minimum depth of the incidence are determined by the parameters of the metal layer, and the optical constants of the external medium. As molecules adsorb and interact at the gold surface, the dielectric properties of the formed layer change, which leads to the transformation of the resonance curve and to the displacement of the resonance angle [7, 9, 15]. [Pg.79]

The reflection coefficient for a homogeneous slab with refractive index N = N is, from (2.72),... [Pg.79]

Standard SE determines the complex ratio p of the reflection coefficients for p-polarized and s-polarized light... [Pg.89]

Finally, n was determined by spectroscopic ellipsometry. The main drawback with this technique when applied to anisotropic samples is that the measured ellipsometric functions tanlF and cos A are related both to the incidence angle and the anisotropic reflectance coefficient for polarizations parallel and perpendicular to the incidence plane. The parameters thus have to be deconvolved from a set of measurements performed with different orientations of the sample [see (2.15) and (2.16)]. The complex refractive index determined by ellipsometry is reliable only in the spectral region where the sample can be considered as a bulk material. In fact, below the absorption... [Pg.68]

Table 10.1. Solute permeability and reflection coefficient for some membranes... Table 10.1. Solute permeability and reflection coefficient for some membranes...
In this case, a stationary-state coupling occurs between the flow of component O and the reaction. The coupling is generally a property of the membrane, and is associated with enzymes that are an integral part of the membrane. Table 10.1 shows the permeability and reflection coefficients for some biomembranes. [Pg.535]

Calculation of reflection coefficients for hydrocarbon molecules and radicals Benchmarks of the model with dedicated experiments... [Pg.24]

Both materials have similar masses and therefore similar reflection coefficients for hydrogen. But, Ta is an exothermic hydrogen occluder and W an endothermic one. Thus, different hydrogen release properties are expected. Figure 13.7 shows the temperature-dependent light intensity in front of Ta... [Pg.324]

Figure 3-20. Correlation between the reflection coefficients for a seines of nonelectrolytes (determined using rabbit gallbladder epithelium) and the permeability coefficients for the same compounds (measured by Runar Collander using Nitella mucromta). Most of the measurements are in the area indicated. [The curve is adapted from Diamond and Wright (1969) used by permission.]... Figure 3-20. Correlation between the reflection coefficients for a seines of nonelectrolytes (determined using rabbit gallbladder epithelium) and the permeability coefficients for the same compounds (measured by Runar Collander using Nitella mucromta). Most of the measurements are in the area indicated. [The curve is adapted from Diamond and Wright (1969) used by permission.]...
When molecules cross the membranes bounding cells or organelles, the reflection coefficients of both internal and external solutes should be included in the Boyle-Van t Hoff relation. Because less than 1 when the external solutes can penetrate, the effect of the external osmotic pressure on Jv is then reduced. Likewise, the reflection coefficients for solutes within the cell or organelle can lessen the contribution of the internal osmotic pressure of each solute. Replacing nj by RTn j / (VM ji v ) (Eq. 2.10) in Equation 3.41 and dividing by a° leads to the following Boyle-Van t Hoff relation for the stationary state condition (Jv = 0 in Eq. 3.40) ... [Pg.168]

If we vary n° and measure V, we can then use Equation 3.45 to obtain the reflection coefficients for various nonelectrolytes in the external solution. [Pg.168]

A. What is the mean reflection coefficient for the external solution ... [Pg.172]

Murphy, R., and Smith, 1 A.C. 1994. Derivation of a weighted-average reflection coefficient for mesophyll cell membranes of Kalanchoe diagremontiana. Planta 193 145-147. [Pg.174]

Here A is a universal constant, is the work function of the surface, and R is the average reflection coefficient for electrons in the range of energies of interest. The experimental situation to which the Richardson equation applies is difficult to realize. Oily recently has it been possible to work under experimental conditions sufficiently controlled to allow an unambiguous determination of all the parameters appearing in it (15). At last it is now clear that the Richardson equation truly... [Pg.50]

Figure 15 Step response of the reflection coefficient for a Cole-Cole dielectric with Bo = 80, Boo = 8 A, a = 0 B, a — 0.5. For //tq > 1 o logarithmic time scale is used (Reproduced by permission from Appl. Sci. Res. in press)... Figure 15 Step response of the reflection coefficient for a Cole-Cole dielectric with Bo = 80, Boo = 8 A, a = 0 B, a — 0.5. For //tq > 1 o logarithmic time scale is used (Reproduced by permission from Appl. Sci. Res. in press)...
In any practical system, there will be at least three layers arranged as follows sample holder, sample, sample holder. If the sample and sample holder layers are an integral number of half-wavelengths thick, we may think of the ensemble as a set of three absentee layers in series and the calcultion carries through as before. These qualitative arguments are put on a firmer footing in Section X, where we calculate the transmission and reflection coefficients for a compound Fabiy-Perot resonator with more than two reflecting surfaces. [Pg.286]

Ultrasound is reflected at the boundary of two media possessing different acoustic impedances. 99.99% of ultrasound is reflected at the air-water boundary when an ultrasound beam is incident upon it from either side. Hence occurrence of air bubbles should be minimized in the coupling medium in order to avoid ultrasound reflection. The reflection coefficient for various interfaces may be estimated from the acoustic impedances of two media forming the interface using equations described in Refs. f... [Pg.3830]

Ellipticity can be induced by reflection because of the fact that the reflection coefficients for the two components in the p and s directions are different. A reflection coefficient comprises two parts, an amplitude term and a phase term, and for this reason complex number representation is used to describe it. The "phasor notation is a convention that provides a compact way of representing reflection coefficients... [Pg.429]

In considering reflection by a surface bearing a film, the Drude equations, below, take into account the infinite number of reflections at substrate-film and film-ambient interfaces. Using the phase numbering of Fig. 4, the overall reflection coefficients for the assembly are designated by R... [Pg.451]

Each of the methods described in Sect. 2.2.1—2.2.5 requires an accurate absolute determination of the exposure to derive sticking probabilities and this is a notoriously difficult parameter to determine quantitatively. The reflection detector techniques, which involve a direct measurement of the reflection coefficient for incident particles at a solid surface, avoid this difficulty and are therefore considerably more reliable for systems where the sticking coefficient is high (> 0.05). [Pg.24]


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