Reciprocal space mapping and methodology

If the system is equipped with a punctual detector, it is necessary at each incidence angle to move the detector over a certain amphtude in 20. This gives rise to two different measurement modes. In the first case, the value of the incidence angle and that of the measurement angle vary simultaneously so as to ensure that the measurement angle is always equal to twice the incidence angle this is referred to as 

Whichever of these two modes is chosen, this type of incremental measurement necessarily implies long measurement times. An alternative to these methods consists of using a curved position sensitive detector. For each value of the incidence angle to, a direct measurement of the intensity distribution according to 20 is made [BOU 02a, BOU 02c, BOU 04]. This makes the mapping much quicker, between 10 and 100 times shorter more than with a punctual detector. We should point out, however, that this method prohibits the use of analyzer crystals. 

0-20 scan. This plot is equivalent to a section parallel to the axis. Sections along the qx axis are obtained by measuring the evolution of the diffracted intensity, for a set value of 20 when the incidence angle co varies. Finally, if for each angle 20, we add all of the intensity diffracted for each co, we get a co - 20 scan, which is 

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