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Piezoresponse force microscopy

Piezoresponse force microscopy (pfm) [11] and Kelvin probe force microscopy (kpfm) [9] were applied to deduce the polarization and local electric potential distribution over the whole cross section of the pzt sample (see Figure 12.3 and Figure 12.4) under static conditions as well as after switching. The details of our setup are described elsewhere [9,11],... [Pg.244]

Parasitic capacitance 176 Payne effect 5, 8, 33, 45, 60, 78 Percolation 33,35 -, threshold 35-36, 41 Permittivity 41-42 Piezoactivity 174 Piezoresponse force microscopy (PFM) 191... [Pg.230]

Shvaitsman VV, Kholkin AL, Verdier C, Lupascu DC (2005) Fatigue-induced evolution of domain stnjcture in ferroelectric lead zirconate titanate ceramics investigated by piezoresponse force microscopy. J Appl Phys 98 094109... [Pg.88]

Roelofs, A., SchneUer, X, Szot, K., Waser, R. Piezoresponse force microscopy of lead titanate nanograins possibly reaching the limit of ferroelectiicity. Appl. Phys. Lett. 81(27), 5231-5233 (2002)... [Pg.86]

Shvartsman, V.V., Wiolkin, A.L., Verdier, C., Yong, Z., and Lupascu, D.C. (2005) Investigation of fatigue mechanism in ferroelectric ceramic via piezoresponse force microscopy. J. Eur. Ceram. Soc.,... [Pg.789]

Declercq, G., Ferri, A., Shao, Z Bayart, A., Saitzek, S., Desfeux, R., Deresmes, D Troadec, D., Costecalde, J., and Rdmiens, D. (2012) Fabrication of La2Ti207 nanostructures by focused Ga ion beam and characterization by piezoresponse force microscopy , Appl. Ferroelectr. Held Jointly 2012 Fur. Conf. Appl. Polar Dielectr. 2012 Int. Symp Piezoresponse Force Microsc. Nanoscale Phenom. Polar Mater. ISAFFCAPDPFM 2012 Inti Symp., pp. 1-3. [Pg.256]

Gruverman, A. and Kalinin, S.V. (2006) Piezoresponse force microscopy and recent advances in nanoscale studies of ferroelectrics. /. Mater. Set, 41 (1), 107-116. [Pg.256]

Desfeux, R., Ferri, A., Legrand, C, Maes, L., Costa, D.A., PouUain, G., Bouregba, R., Soyer, C., and Remiens, D. (2008) Nanoscale investigations of switching properties and piezoelectric activity in ferroelectric thin films using piezoresponse force microscopy. Int. J. Nanotechnol, 5 (6/7/8), 827. [Pg.256]

Ferri, A., Saitzek, S., Da Costa, A., Desfeux, R Leclerc, G Bouregba, R., and Poullain, G. (2008) Thickness dependence of the nanoscale piezoelectric properties measured by piezoresponse force microscopy on... [Pg.257]

ZnO nanobelts were also considered for applications as nanosensors and tianoac-tuators. The piezoelectric coefficient of a ZnO nanobelt was measured using AFM with a conductive tip [54]. For this purpose, ZnO nanobelts were dispersed on a (10 0) Si wafer coated with Pd. The nanobelts were then coated with 5 nm layer of Pd. It was ensured that the top and bottom surfaces of the nanobelts were not shorteffective piezoelectric coefficient d33 for the (0001) surface of the nanobelts was measured by piezoresponse force microscopy. The d33 coefficient was found to vary from 26.7 to 14.3 pm with increasing frequency from 30 to 150 kHz. These... [Pg.382]


See other pages where Piezoresponse force microscopy is mentioned: [Pg.195]    [Pg.241]    [Pg.242]    [Pg.242]    [Pg.275]    [Pg.292]    [Pg.343]    [Pg.355]    [Pg.358]    [Pg.361]    [Pg.89]    [Pg.190]    [Pg.191]    [Pg.595]    [Pg.162]    [Pg.614]    [Pg.615]    [Pg.773]    [Pg.256]    [Pg.618]    [Pg.595]    [Pg.346]    [Pg.426]    [Pg.875]   
See also in sourсe #XX -- [ Pg.195 , Pg.292 , Pg.343 , Pg.359 ]

See also in sourсe #XX -- [ Pg.774 ]




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Piezoresponse force microscopy (pfm)

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