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Permitivity of free space

Pathway of reaction, 1167 consecutive reactions, 1259 definition, 1259 and FTTR spectroscopy, 1259 hydrogen evolution reaction, 1259 isotopic analysis. 1259 mechanism, 1259 parallel reactions, 1259 Permitivity of free space. 875 Perez, 1519... [Pg.46]

The Equation assumes that all dipoles are independent. It relates the values of Er and eu measured at temperature T to the concentrations N and dipole moments Pi of the polar species (k is Boltzmann s constant and Eq is the permitivity of free space). [Pg.30]

Here, e and Er are the permitivities of free-space and the sample, respectively, and... [Pg.83]

Here a is the bulk ionic or dc conductivity is the angular frequency (27rf) r is the dipole relaxation time is the relaxed dielectric constant or low frequency/high temperature dielectric constant (relative permittivity due to induced plus static dipoles) is the unrelaxed dielectric constant or high frequency/low temperature dielectric constant (relative permittivity due to induced dipoles only) o is the permitivity of free space E p is the electrode polarization term for permittivity and E"-p is the electrode polarization term for loss factor. The value of E p and E"p is usually unity, except when ionic conduction is very high (75). [Pg.8358]

Location of Compressor Building. The main compressor building for hydrogen gas compressor stations shall be located at such clear distances from adjacent property not under control of the company as to minimize the hazard of communication of fire to the compressor building from structures on adjacent property. Sufficient open space should be provided around the building to permit the free movement of firefighting equipment. [Pg.168]

An electric field in the semiconductor may also produce passivation, as depicted in Fig. 6.1c. In semiconductors the concentration of free charge carriers is smaller by orders of magnitude than in metals. This permits the existence of extended space charges. The concept of pore formation due to an SCR as a passivating layer is supported by the fact that n-type, as well as p-type, silicon electrodes are under depletion in the pore formation regime [Ro3]. In addition a correlation between SCR width and pore density in the macroporous and the mesoporous regime is observed, as shown in Fig. 6.10 [Thl, Th2, Zh3, Le8]. [Pg.102]


See other pages where Permitivity of free space is mentioned: [Pg.77]    [Pg.158]    [Pg.162]    [Pg.44]    [Pg.393]    [Pg.271]    [Pg.371]    [Pg.588]    [Pg.626]    [Pg.44]    [Pg.111]    [Pg.331]    [Pg.557]    [Pg.535]    [Pg.82]    [Pg.136]    [Pg.354]    [Pg.335]    [Pg.866]    [Pg.77]    [Pg.158]    [Pg.162]    [Pg.44]    [Pg.393]    [Pg.271]    [Pg.371]    [Pg.588]    [Pg.626]    [Pg.44]    [Pg.111]    [Pg.331]    [Pg.557]    [Pg.535]    [Pg.82]    [Pg.136]    [Pg.354]    [Pg.335]    [Pg.866]    [Pg.42]    [Pg.248]    [Pg.7]    [Pg.16]    [Pg.658]    [Pg.59]    [Pg.132]    [Pg.138]    [Pg.381]    [Pg.51]    [Pg.136]    [Pg.161]    [Pg.573]    [Pg.430]    [Pg.88]    [Pg.179]    [Pg.17]    [Pg.2297]    [Pg.303]    [Pg.226]    [Pg.55]    [Pg.592]    [Pg.680]    [Pg.1023]   
See also in sourсe #XX -- [ Pg.113 ]




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Permits

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