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Particle identification

Characterisation of Segregation. For small levels of the segregation pA of element A expressed in monolayers, equation (4) may be written  [Pg.178]

Here it is assumed that upon fracture of a grain boundary, half of the segregant is left on each free surface, and that the segregant atoms pack at the same density as they would in the pure elemental state. [Pg.179]


Particle Morphology, Size, and Distribution. Many fillers have morphological and optical characteristics that allow these materials to be identified microscopically with great accuracy, even in a single particle. Photomicrographs, descriptions, and other aids to particle identification can be found (1). [Pg.366]

Microscopy (qv) is appHed when particle identification and, perhaps, shape evaluation ate important in addition to size. Shape characterization is used in the abrasives (qv) industries, pollution or contamination assessment, and forensic studies (see Forensic CHEMISTRY). [Pg.131]

As already mentioned, particle identification is achieved by energy-loss measurement (the AE- E method) or by velocity measurement (TOP method). [Pg.164]

The areas where the use of the track model has been found particularly expedient are (1) LET variation of product yields in the radiation chemistry of liquids (2) the yield of escaped ions and its variation with particle LET (3) energy loss in primary excitations and ionizations (4) radiation-induced luminescence and (5) particle identification. [Pg.52]

Particle Identification Crystal Structure Density (g/cm3) Wt% Incorporation... [Pg.206]

Mills G, Hoffmann MR (1993) Photocatalytic degradation of pentachlorophenol on Ti02 particles identification of intermediates and mechanism of reaction. Environ Sci Technol 27 1681-1689... [Pg.152]

Using polished pellets 1 inch in diameter, a microscopic particle classification analysis for lithotypes, developed for this research by the authors (I), was made of the various coals. Only vitrain, durain, and fusain were counted. Results are presented in Table IV. Standard visual parameters were used for particle identification. An analysis of this type, although not necessarily conclusive, is important for a relative comparison. Results of a check between... [Pg.368]

Devise a way, using measurements of dE/dx and E, to build a particle identification system. [Pg.534]

Fig.2. Plot of m/q determined from deflection in the RPMS vs silicon detector particle identification parameter. Fig.2. Plot of m/q determined from deflection in the RPMS vs silicon detector particle identification parameter.
The reliability of the multiplicity measurement depends on the number of the detectors employed, a total of solid angles subtended by them and the efficiency and accuracy of the particle identification. The probability of two charged-particles entering a detector decreases with the number of the detectors, while the solid angle uncovered and the complexity of electronic processing of the signals from the detectors increase. As a result, ten detectors to cover the target is a reasonable compromise. The efficiency of... [Pg.491]

This principle of compensation enables the microscopist to measure the thickness of a particle if the birefringence is known or to measure the biregringence of a particle if the thickness is known. The birefringence of a particle is useful for particle identification by consulting tables of optical constants. [Pg.23]

Su DS, et al. Surface chemistry of Ag particles identification of oxide species by aberration-corrected TEM and by DFT calculations. Angew Chem Int Ed. 2008 47(27) 5005-8. [Pg.33]

Various means of particle identification are possible with optical microscopy. These include dispersion staining for identification of asbestos particles [44] and the use of various mounting media [45], Proctor et. al. [46,47] dispersed particles in a solidifying medium of Perspex monomer and hardener. This was poured into a plastic mold that was slowly rotated to ensure good mixing. Microscope analyses were carried out on thick sections a lower size limit of 5 p,m was due to contamination. [Pg.150]


See other pages where Particle identification is mentioned: [Pg.161]    [Pg.164]    [Pg.164]    [Pg.164]    [Pg.165]    [Pg.166]    [Pg.229]    [Pg.128]    [Pg.178]    [Pg.52]    [Pg.105]    [Pg.505]    [Pg.555]    [Pg.451]    [Pg.492]    [Pg.112]    [Pg.112]    [Pg.72]    [Pg.309]    [Pg.321]    [Pg.118]    [Pg.341]    [Pg.41]    [Pg.67]    [Pg.1521]    [Pg.50]    [Pg.488]    [Pg.177]   
See also in sourсe #XX -- [ Pg.3 , Pg.5 , Pg.7 , Pg.9 , Pg.9 ]




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