Optical sectioning wide field

Neil, M. A. A., Squire, A., Juskaitis, R., Bastiaens, P. I. H. and Wilson, T. (2000). Wide-field optically sectioning fluorescence microscopy with laser illumination. J. Microsc. 197, 1-4. 

Optical sectioning in wide-field microscopy may be achieved using the method of structured illumination. For example, a diffraction grating can be imaged in the plane of the sample, and the intensity resulting from this plane can be described by... 

A wide variety of measurements can now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomic force microscopy), optical (e.g. near-field and far-field fluorescence microscopies) and hybrid teclmiques. This contribution addresses only Arose teclmiques tliat are at least partially optical. Single-particle electrical and force measurements are discussed in tire sections on scanning probe microscopies (B1.19) and surface forces apparatus (B1.20). 

The author is fortunate to have the opportunity, as a consultant, to review and study CVD processes, equipment, materials and applications for a wide cross-section of the industry, in the fields of optics, optoelectronics, metallurgy and others. He is in a position to retain an overall viewpoint difficult to obtain otherwise. 

One of the properties of a class of materials known as chalcogenide glasses is that they exhibit a wide spectrum of photoinduced effects. Photoinduced phenomena have recently been extensively studied (see corresponding references in previous sections), partly as an interesting subject for fundamental research in the field of disordered sohds and partly due to the potential apphcation of these phenomena in opto(photo)electronics (xerography and xeroradiography, optical memories, optical circuits, photoresists, etc.). 

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