Optical micrographs of polymer

Figure 4. Polarized optical micrographs of polymer blends, (a) two homopolymer blend with PE/PS = 50/50 (100x). (b) two homopolymers and PE-g-PS copolymer blend with PE/PE-g-PS/PS = 45/10/45 (lOOx).

Figure 4. Optical micrograph of polymer I at 128 C. Crossed polarizers. Magnification 134X. (Reproduced from Ref. 11. Copyright 1987 American Chemical Society.)...

Figure 8. Optical micrograph of polymer II at 162.4 C. Crossed polarizers. Magnification 200X.

Figure 2. Representative optical micrographs of poly-HEMA cross-linked with EDMA. (a) and (b) represent the gel-type polymer produced by suspension co-polymerization in the dry and swollen state, respectively, (c) and (d) represent the macroreticular polymer produced by suspension co-polymerization in the presence of a porogen (toluene), in the dry and swollen (vide infra) state, respeetively [13], (Reprinted from Ref [15], 1996, with permission from Elsevier.)...

Fig. 19 Polarized optical micrographs of several polymers. From top left to lower right, a random ethylene-octene copolymer high density polyethylene samples 3-6...

Fig. 13. Optical micrograph of fra-ture surface of glass-filled epoxy polymers showing the crack front pinned between glass particles 22) (Arrow indicates direction of crack growth)...

Fig. 16 A Optical micrograph of two-dimensional photopattern generated by photolysis of a metallized hb-PY (81) through a copper-negative mask. B Image with a higher magnification and C molecular structure of polymer complex 81...

Fig. 16. Optical micrographs of decomposition structures obtained from 50/50 blend solutions containing initially 3 wt% of total polymer. Storage periods t at room temperature and annealing temperature as indicated...

Figure 12 Transmission optical micrographs of the fibrillar polymer of KC o [8].

K) (a) optical micrograph of the related unfunctiO-nalized polymer blend (b). The scattering vector, qx (41T/X) sin (0/2) where 0 is the observation angle. dS/dn is the differential scattering cross-section per atom with respect to the solid angle, as normalized to a unit volume. 

In a typical experiment, polyphthalaldehyde was dissolved in bis-(2-methoxyethyl) ether or cyclohexanone, to which was added the onium salt at 10 wt% to the polymer. Films spin coated on Si wafers were baked at 100°C for 10 minutes and then image-wise exposed. Optical micrographs of the resist images generated upon UV, e-beam, and x-ray radiations are exhibited in Figures 7a, b, and c, respectively. 

Sc Sa, Sa->Ch, and Ch->I respectively. The smectic D phase is observed in the hexyl series but not in the decyl analogs. This observation suggests that the increased flexibility provided by the longer alkyl group destabilizes the higher temperature smectic phases, while stabilizing the smectic C. Optical micrographs of the PDBPB polymer exhibit a fine broken focal conic fan texture for Sq phase, and focal conic fan textures for the Sa phase and cholesteric texture. 

Figure 2. DSC thermograms of anionic PHBPB polymer in a heating and cooling cycle by 20 °C/min arrows indicate phase transitions (a) Optical micrographs of this polymer taken during heating process on a hot-stage by 10 °C/min. 25 °C (b), 153 (c) and 166 T (d). (280x)...

Figure 11.25. A magnified polarizing optical micrograph of the grating in Fig. 11.24, showing the polymer-rich dark) and liquid crystal-rich regions clear). A remaining polymer network in liquid crystal regions is visible. The width of the fringes is 40 xm.

Fig. 4.8 True color optical micrograph of a continuous 26k PS-b-PMMA film with thickness gradient. The lower section is a continuation of the upper section. Film was annealed for 6 h at 170 °C, and the image shows the addition of four successive lamellae to the block copolymer film with increasing thickness, and the corresponding terraced patterns. Labels indicate when the film thickness verifies hs = n+ ll2)do, where n = 2-6. Reprinted with permission from ref. [88], J. Polym. Sci. Part B Polym. Phys. 2001, 39, 2141. Copyright 2001 John Wiley and Sons...

FIGURE 8.72 Patterns used to illustrate requirements for conducting polymer-based circuitry. Dots indicate placement of the probe wires for conductivity measurements. An optical micrograph of this interdigjtated pattern after contact transfer to PDMS. Inherent limitations in self-assembled monolayers (SAM) are presumably responsible for the defects observed. (From Gorman, C.B., Biebuyck, H.A., and Whitesides, G.M., Chem. Mater., 7,526,1995. With permission.)... 

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