Optical diffraction devices

The fabrication process of vanadium oxide (VO2) has also been studied using RBS/C. Since optieal and electrical properties of VO2 are dramatically changed at 68°C due to phase transition, VO2 is regarded as one of the candidates for thermally activated electronic or optical switching devices for optieal fibers or sensors. To obtain the desired properties, the development of the fabrication process for very thin films, without crystalline defects on various substrates, is required. Single-crystalline VO2 thin films on (0001) plane of a sapphire substrate have been synthesized by a laser ablation method. The quality of VO2 was examined by X-ray diffraction and RBS/C method. The eleetrieal resistanee and the optical transmittance of the VO2 film were measured under inereasing and deereasing temperatures. At a temperature of 68 °C, an abrupt transition of resistanee from metal to... 

Calibration of optical devices is most frequently performed using polystyrene latex spheres that can be generated from dilute aqueous suspensions and dried before measurement. The ASTM developed a standard for the use of reticles, or disks, that can be placed in the path of the beam of a laser diffraction device for the purpose of calibration. Some manufacturers maintain that their instmments... 

TaF has been characterized by ir, Raman, x-ray diffraction, and mass spectrometry (3,11,12). TaF has been used as a superacid catalyst for the conversion of CH to gasoline-range hydrocarbons (qv) (12) in the manufacture of fluoride glass and fluoride glass optical fiber preforms (13), and incorporated in semiconductor devices (14). TaF is also a catalyst for the Hquid-phase addition of HF to polychlorinated ethenes (15). The chemistry of TaF has been reviewed (1,16—19). Total commercial production for TaF is thought to be no more than a few hundred kilograms aimuaHy. 

An interesting feature of polarized IR spectroscopy is that rapid measurements can be performed while preserving molecular information (in contrast with birefringence) and without the need for a synchrotron source (X-ray diffraction). Time-resolved IRLD studies are almost exclusively realized in transmission because of its compatibility with various types of tensile testing devices. In the simplest implementation, p- and s-polarized spectra are sequentially acquired while the sample is deformed and/or relaxing. The time resolution is generally limited to several seconds per spectrum by the acquisition time of two spectra and by the speed at which the polarizer can be rotated. Siesler et al. have used such a rheo-optical technique to study the dynamics of multiple polymers and copolymers [40]. 

Experimental equipment for X-ray diffraction methods has improved enormously in recent years. CCD detectors and focusing devices (Goepel mirror) have drastically reduced the data acquisition time. Cryogenic systems have been developed which allow structural studies to be extended down to the liquid helium temperature range. These developments have had important implications for SCO research. For example, fibre optics have been mounted in the cryostats for exploring structural changes effected by light-induced spin state conversion (LIESST effect). Chaps. 15 and 16 treat such studies. 

The basic instrumentation used for spectrometric measurements has already been described in the previous chapter (p. 277). Methods of excitation, monochromators and detectors used in atomic emission and absorption techniques are included in Table 8.1. Sources of radiation physically separated from the sample are required for atomic absorption, atomic fluorescence and X-ray fluorescence spectrometry (cf. molecular absorption spectrometry), whereas in flame photometry, arc/spark and plasma emission techniques, the sample is excited directly by thermal means. Diffraction gratings or prism monochromators are used for dispersion in all the techniques including X-ray fluorescence where a single crystal of appropriate lattice dimensions acts as a grating. Atomic fluorescence spectra are sufficiently simple to allow the use of an interference filter in many instances. Photomultiplier detectors are used in every technique except X-ray fluorescence where proportional counting or scintillation devices are employed. Photographic recording of a complete spectrum facilitates qualitative analysis by optical emission spectrometry, but is now rarely used. 

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