New process targets

Research into new manufacturing processes is most commonly carried out in multinationals or those companies whose main or sole business is in contract manufacturing area. These companies operate in both the fine chemical and the bulk manufacturing sectors. New process research in these companies has the following driving forces  

The identification and evaluation procedure for these research targets is essentially the same as is used for new products. New technology is increasingly being developed in smaller companies with a specific competence. An example would be the work on production scale microreactors by companies such as CPC Cellular Process Chemistry Systems, whose technology is being taken up by large companies in the pilot scale manufacture of fine, speciality and medicinal chemicals. 

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Haggin, J. New Processes Target Methanol Production, Off-gas Cleaning, Chem. Eng. News, Mar. 28, 1994. pp. 29-31. 

Haggin J. New processes target methanol production, off-gas cleaning. Chem Eng News 1994 72(13) 29-31. 

Table 9.5 Process Targets for the Profile Line and the New High-Rate Screw...

The use of solvents that may have themselves unfriendly characteristics. Therefore, the development of new processes having lower environmental impact represents one important target (1,2). in the present work we report about... 

Despite the fact that near infrared spectroscopy (NIR) has been used industrially for decades [36], there has been hesitance to accept and trust new process analytical measurement technologies as equivalent or superior to traditional methods. For example, when a discrepancy between online NIR and laboratory analyses is observed, it is rare that the destructive reference methods are ever targeted as the source of error, despite the fact that NIR is often the more precise method. The hesitance to trust more advanced, multivariate tools (which are perhaps less directly understood) has certainly been a detriment to progress in deploying PAT. 

A cumulative sum (or cusum) chart is a type of control chart that can detect changes in process average more powerfully than an x chart. A reference value K is chosen. K can be the process target value, historical average, or any convenient value. As new values xh. .., xn are observed, the cumulative sums... 

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