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Near-field imaging technique, scanning tunnelling microscopy

The first and best known near-field technique to measure electrical properties in the nanoscale is of course Scanning Tunnelling Microscopy (STM). Since its invention by Binnig et al., STM has been used to explore the mechanisms of lots of phenomena on surfaces [289-294], ranging from experiments concerning the local work function to the use of an STM-tip to induce electropolymerisation [295]. Most of all, STM provides us with atomically resolved images of the surface structure. [Pg.170]

See other pages where Near-field imaging technique, scanning tunnelling microscopy is mentioned: [Pg.311]    [Pg.2487]    [Pg.216]    [Pg.124]    [Pg.5]    [Pg.2487]    [Pg.4590]    [Pg.4593]    [Pg.2]    [Pg.616]    [Pg.405]    [Pg.470]    [Pg.501]    [Pg.276]    [Pg.228]    [Pg.16]    [Pg.1]    [Pg.83]    [Pg.229]    [Pg.278]   
See also in sourсe #XX -- [ Pg.311 ]



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Field microscopy

Microscopy image

Microscopy imaging

Microscopy near-field

Microscopy techniques

Near-field

Near-field imaging technique, scanning tunnelling

Scanning tunnel microscopy

Scanning tunneling

Scanning tunneling microscopy

Scanning tunnelling

Scanning tunnelling microscopy

Technique scanning

Tunneling microscopy

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