Nanoscale Inhomogeneity of Conducting-Polymer-Based Materials

Nanostructured Conductive Polymers Edited by Ali Eftekhari 2010 John Wiley Sons, Ltd 

2 Direct Local Measurements of Nanoscale Inhomogeneity of Conducting and Semiconducting Polymers 

2 Atomic Force Microscopy (AFM), Kelvin Probe Force Microscopy (KFM), and Electric Force Microscopy (EFM) 

As far as can be seen from the available literature, the first locally resolved studies of nanoscale inhomogeneity of conducting and semiconducting polymers only appeared in 

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Nanoscale Inhomogeneity of Conducting-Polymer-Based Materials... 

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