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Nanoparticle atomic force microscopy

Domenech A, Domenech-Carb6 MT, Mas X (2007) Identification of lead pigments in nanosamples from ancient paintings and polychromed sculptures using voltammetry of nanoparticles/atomic force microscopy. Talanta 71 1569-1579. [Pg.146]

Ebenstein, Y., Nahum, E., and Banin, U., Tapping mode atomic force microscopy for nanoparticle sizing Tip-sample interaction effects, Nano Lett., 2, 945, 2002. [Pg.577]

FIGURE 7.1 Atomic force microscopy image of prednisolone-loaded Compritol nanoparticles produced by cold homogenization. Imaging was performed by using the noncontact mode. The formulation is composed of 5% Compritol, 1% prednisolone, 2.5% poloxamer 188, and 92.5% water. (From zur Miihlen, A. and Mehnert, W., Pharmazie, 53, 552-55, 1998. With permission.)... [Pg.6]

Dubes, A., et al.. Scanning electron microscopy and atomic force microscopy imaging of solid lipid nanoparticles derived from amphiphihc cyclodextrins. Eur. J. Pharm. Biopharm., 55, 279-82, 2003. [Pg.14]

The most popular tools for the visualization of engineered nanoparticles are electron and scanning probe microscopes. The visualization, the state of aggregation, dispersion sorption, size, structure, and shape can be observed by means of atomic force microscopy (AFM), scanning electron (SEM), and transmission electron microscopy (TEM). Analytical tools (mostly spectroscopic) can be coupled to... [Pg.26]

Fig. 5.8. Atomic force microscopy picture of RuxSey deposited by dipping onto HOPG surface after annealing in argon at 210°C to eliminate the stabilizer (octadecanthiol). (a) 3D representation gives an idea of the nanoparticle agglomeration, and (b) 2D the islands formed due to the agglomeration process during annealing. Fig. 5.8. Atomic force microscopy picture of RuxSey deposited by dipping onto HOPG surface after annealing in argon at 210°C to eliminate the stabilizer (octadecanthiol). (a) 3D representation gives an idea of the nanoparticle agglomeration, and (b) 2D the islands formed due to the agglomeration process during annealing.
Figure 19.2 Self-similarity analysis for nanotextured silver surfaces prepared in different ways. The root mean square roughness inferred from atomic force microscopy is plotted versus measurement area. The various surfaces are 100 nm thick evaporated silver films (solid squares, red line)-, 5.2 nm thick evaporated silver films (open circles, green line) nanoparticle films assembled from colloid attachment to self-assembled monolayers (solid circles, blue line) films from deliberate precipitation of silver colloid (solid up-triangles, black line) Tollens reaction films (open down-triangles, orange line). Lines with slopes H = 1.0 and H = l.S representing two-dimensional and 1.5 dimensional surfaces respectively are... Figure 19.2 Self-similarity analysis for nanotextured silver surfaces prepared in different ways. The root mean square roughness inferred from atomic force microscopy is plotted versus measurement area. The various surfaces are 100 nm thick evaporated silver films (solid squares, red line)-, 5.2 nm thick evaporated silver films (open circles, green line) nanoparticle films assembled from colloid attachment to self-assembled monolayers (solid circles, blue line) films from deliberate precipitation of silver colloid (solid up-triangles, black line) Tollens reaction films (open down-triangles, orange line). Lines with slopes H = 1.0 and H = l.S representing two-dimensional and 1.5 dimensional surfaces respectively are...
X-ray diffraction technique is a non-destructive analytical technique that reveals information about crystallographic structure, chemical composition and physical properties of nanostructured materials. UV/Vis spectroscopy is routinely used in the quantitative determination of films of nanostructured metal oxides. The size, shape (nanocomb and nanorods etc,) and arrangement of the nanoparticles can be observed through transmission electron microscope (TEM) studies. Surface morphology of nanostructured metal oxides can be observed in atomic force microscopy (AFM) and scanning electron microscopy (SEM) studies. [Pg.218]


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