Molecular ions photoelectron spectroscopy

The elemental composition, oxidation state, and coordination environment of species on surfaces can be determined by X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) techniques. Both techniques have a penetration depth of 5-20 atomic layers. Especially XPS is commonly used in characterization of electrocatalysts. One common example is the identification and quantification of surface functional groups such as nitrogen species found on carbon-based catalysts.26-29 Secondary Ion Mass spectrometry (SIMS) and Ion Scattering Spectroscopy are alternatives which are more surface sensitive. They can provide information about the surface composition as well as the chemical bonding information from molecular clusters and have been used in characterization of cathode electrodes.30,31 They can also be used for depth profiling purposes. The quantification of the information, however, is rather difficult.32... 

Spectroscopy produces spectra which arise as a result of interaction of electromagnetic radiation with matter. The type of interaction (electronic or nuclear transition, molecular vibration or electron loss) depends upon the wavelength of the radiation (Tab. 7.1). The most widely applied techniques are infrared (IR), Mossbauer, ultraviolet-visible (UV-Vis), and in recent years, various forms ofX-ray absorption fine structure (XAFS) spectroscopy which probe the local structure of the elements. Less widely used techniques are Raman spectroscopy. X-ray photoelectron spectroscopy (XPS), secondary ion imaging mass spectroscopy (SIMS), Auger electron spectroscopy (AES), electron spin resonance (ESR) and nuclear magnetic resonance (NMR) spectroscopy. 

Herdt GC, Czandema AW (1997) Metal overlayers on organic functional groups of self-organized molecular assemblies. 7. Ion scattering spectroscopy and X-ray photoelectron spectroscopy of Cu/CHs and CU/COOCH3. J Vac Sci Technol A 15 513-519... 

Polymer Surface Analysis. The major technique used for the surface analysis of polymers has been X-ray photoelectron spectroscopy (XPS or ESCA). However, this technique is often not adequate to determine the molecular structure of polymers. This has prompted many workers to explore the potential of SIMS for this work (11-16). Significant problems encountered with ion beam bombardment in conjunction with electron beam charge neutralization have been drift in the polymer surface potential and thermal damage from the combined effects of the electron and ion beams. These problems do not exist when utilizing FAB in conjunction with photoelectron charge neutralization. 

Key words clusters, ion mobility spectrometry, photoelectron spectroscopy, collision-induced dissociation, molecular structure optimization... 

Intermolecular relaxation effects are a central issue in the interpretation of the ultraviolet photoelectron spectroscopy (UPS) of molecular solids. These relaxation effects result in several significant characteristics of UPS valence spectra, intermolecular relaxation phenomena lead to localized electron molecular-ion states, which are responsible for rigid gas-to-solid molecular spectral energy shifts, spectral line broadening, and dynamic electronic localization effects in aromatic pendant group polymers. 

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