Microscopy tapping mode

Stark, R. W. and Heckl, W. M. (2000). Fourier transformed atomic force microscopy tapping mode atomic force microscopy beyond the Hookian approximation. Surface Science 457,219-28. [319]... 

Fig. 5. Hexagonal and stripe patterns observed via atomic force microscopy (Tapping Mode). Phase contrast images of (a) polystyrene-fe-poly(ethylene-co-butylene)-6-polystyrene, Kraton G1657 and (b) Kraton G1650 (82).

Zong Q, inniss D, K]oiier K and Eiings V B 1993 Fractured poiymer/siiica fiber surface studied by tapping mode atomic force microscopy Surf. Sc/. Lett. 290 L688... 

Flansma P K ef a/1994 Tapping mode atomic force microscopy in iiquids Appl. Phys. Lett. 64 1738... 

Tamayo, J. and Garcia, R., Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy. Appl. Phys. Lett., 71(16), 2394-2396 (1997). 

Tamayo, J. and Garcia, R., Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy. Appl Phys. Lett., 73(20), 2926-2928 (1998). Gotsmann, B., Seidel, C., Anezykowski, B. and Fuchs, H., Conservative and dissipative tip-sample interaction forces probed with dynamic AFM. Phys. Rev. B Condens. Matter, 60, 11051-11061 (1999). 

Bar, G., Delineau, L., Hafele, A. and Whangbo, M.H., Investigation of the stiffness change in, the indentation force and the hydrophobic recovery of plasma-oxidized polydimethyl-siloxane surfaces by tapping mode atomic force microscopy. Polymer, 42(8), 3627-3632 (2001). 

FIGURE 12.10 Tapping mode atomic force microscopy (AFM) images of the section analyzes of ethylene-propylene-diene monomer (EPDM) rubber-melamine fiber composites. A, composite containing no dry bonding system B, composite containing resorcinol, hexamine, and silica in the concentrations 5, 3, and 15 phr, respectively. 

Zhong, Q., Innis, D., Kjoller, K., and Elings, V., Fractured polymer/silica fiber surface studied by tapping mode atomic force microscopy. Surf. Sci. Lett., 290, 688, 1993. 

Cleveland, J.P., Anczykowski, B., Schmid, A.E., and Elings, V.B., Energy dissipation in tapping-mode atomic force microscopy, Appl. Phys. Lett., 12, 2613, 1998. 

Ebenstein, Y., Nahum, E., and Banin, U., Tapping mode atomic force microscopy for nanoparticle sizing Tip-sample interaction effects, Nano Lett., 2, 945, 2002. 

Magonov, S.N., Elings, V., Cleveland, J., Denley, D., and Whangbo, M.-H., Tapping-mode atomic force microscopy study of the near-surface composition of a styrene-butadiene-styrene triblock copolymer film, Surf. Sci., 389, 201, 1997. 

Resch, R. Friedbacher, G. Grasserbauer, M. Kanniainen, T. Lindroos, S. Leskela, M. Niinisto, L. 1997. In situ investigations on the SILAR-growth of ZnS films as studied by tapping mode atomic force microscopy (TM-AFM). Fresenius J. Anal. Chem. 358 80-84. 

Tapered module design, 15 835 Tapholes, blast furnace, 14 505-507, 509 Taphonomy, 5 752 Tapioca/cassava starch, 4 724t Tapping mode, in atomic force microscopy, 77 63 Tapping-mode AFM, 24 84 Tapping mode atomic force microscopy (TMAFM), 14 465, 16 501 Taq polymerase, 72 513 Taquidil... 

Figure 28. Solid-state dc electrical measurements of polyphenylene oxide in an ITO PPO Gain sandwich. The thickness of the polymer was measured by tapping-mode atomic force microscopy. (Reprinted with permission from ref 23. Copyright 2004 American Chemical Society.)...

Leuba, S.H., Yang, G., Robert, C., Samori, B., van Holde, K., Zlatanova, J., and Bustamante, C. (1994) Three-dimensional structure of extended chromatin fibers as revealed by tapping-mode scanning force microscopy. Proc. Nat. Acad. Sci. USA 91, 11621-11625. 

Tapping-mode atomic force microscopy studies showed that as these hyperbranched PAA films became somewhat less smooth as they increased in thickness through successive grafting stages [24]. For example, a very smooth initial single-crystal Au(lll) surface with a root mean square (RMS) roughness of 0.2 nm (over a 2 xm x 2 im area) had its roughness increased to... 

Fig. 19 AFM images of G-wires freshly adsorbed onto mica imaged via tapping mode (a). Same sample imaged by the same tip 24 h later after drying in an oven at 37 °C (b). Low current scanning tunneling microscopy image of G-wires freshly adsorbed on mica (c). Note the preferential orientation is not a sample preparation artefact, e.g., due to rinsing [126]. Reprinted with permission...

Vandamme N, Snauwaert J, Janssens E, Vandeweert E, Lievens P, Van Haesendonck C (2004) Visualization of gold clusters deposited on a dithiol self-assembled monolayer by tapping mode atomic force microscopy. Surf Sci 558 57-64... 

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