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MICROGRAPHY

Fig. 5. A 90° polished cross section of a production white titania enamel, with the microstructure showing the interface between steel and direct-on enamel as observed by reflected light micrography at 3500 x magnification using Nomarski Interface Contrast (oil immersion). A is a steel substrate B, complex interface phases including an iron—nickel alloy C, iron titanate crystals D, glassy matrix E, anatase, Ti02, crystals and F, quart2 particle. Fig. 5. A 90° polished cross section of a production white titania enamel, with the microstructure showing the interface between steel and direct-on enamel as observed by reflected light micrography at 3500 x magnification using Nomarski Interface Contrast (oil immersion). A is a steel substrate B, complex interface phases including an iron—nickel alloy C, iron titanate crystals D, glassy matrix E, anatase, Ti02, crystals and F, quart2 particle.
Fig.l. Scanning electron micrography (a) and electron diffraction pattern (b) of Sn02 film on PET substrate prepared by ECR-MOCVD. [Pg.386]

High resolution transmission electron microscopy (HRTEM) micrographies were performed with a JEOL JEM-3010 microscope operating at 300 kV (Cs= 0.6 mm, point resolution 1.7 A). Images were recorded with CCD camera (MultiScan model 794, Gatan, 1024 x 1024 pixels, pixel size 24 x 24 pm2). The powder samples were mixed in ethanol and then ultrasonicated for 10 min. A drop of the wet sample was placed on a copper grid and then allowed to dry for 10 min before TEM analysis. [Pg.13]

Figure 1. left XRD of calcined SBA-15 (curve A) and hybrid GFP-SBA-15 (curve B) right TEM micrography of calcined SBA-15. [Pg.13]

Scanning electron micrography indicates that zeolite crystals are homogeneously distributed in the composites. Micrographs show the characteristic aggregates of octahedral crystals of zeolite X from methods A and C and the cubic crystals of zeolite A from method B. [Pg.391]

Scandium oxide, 32 43-44 Scanning electron micrography, copper, 31 255... [Pg.192]

Limiting resolution of sensitivity was assessed by scanning electron micrography (SEM) micrographs. [Pg.169]

Transmission electron micrography has, remarkably, been successfully used to image micelles formed by block copolymers in dilute solutions. Price and coworkers used two preparation methods. In the first method (Price and Woods 1973), f reeze etching, a drop of solution was rapidly frozen by quenching in liquid nitrogen. Solvent was then allowed to evaporate from a freshly microtomed surface of the droplet. Finally, a replica was made of collapsed micelles raised proud from the frozen surface. In the second method (Booth et al. 1978), a drop of micellar solution was allowed to spread and evaporate on a carbon substrate, and 0s04 was used to selectively stain one of the blocks. [Pg.16]

In HeLa cells, the striking morphological alterations which follow exposure of the cells to butyrate are characterized by the extension of neurite-like processes (Fig. 1). No significant differences in the fine structure of the ceil surface was observed by scanning electron micrography (Fig. 1). In addition to butyrate, propionate and pentanoate but not other homologous... [Pg.223]

Single crystals for electron micrography and diffraction were obtained by dissolution of the polymer in nitrobenzene at 170°C followed by filtration. The solution was slowly cooled to 134°C and kept at this temperature for 12 h. The polymer that had crystallized was filtered and redissolved in nitrobenzene at 170°C, cooled to 139°C then very slowly to 136°C, kept at this temperature for 24 h and cooled to room temperature leaving the polymer single crystals in suspension in nitrobenzene. A total of 25 reflections could be observed on the electron dif-fractogram (hkO section) of this material. This was an improvement over the X-ray fiber diagram since only five reflections had been recorded on the equator (see Table I). [Pg.268]

The resulting PE-fr-PMMA was purified by soxhlet extraction with THF and characterized by NMR, DSC, and TEM micrography (Table 1). The TEM of the obtained PE-fr-PMMA revealed unique morphological features which depended on the content of the PMMA segment. The block copolymer possessing 75 wt % PMMA contained 50-100 nm spherical polyethylene lamellae uniformly dispersed in the PMMA matrix (Fig. 12). Moreover, the PE-b-PMMA block copolymers effectively compatibilized homo-PE and homo-PMMA at a nanometer level (Fig. 13). [Pg.94]

In the majority of cases when one deals with nanosize superparamagnetic grains, polydispersity seems to be an inherent feature. The independent measurement of the size distribution function, such as by electron micrography, is a painstaking and rare opportunity. Besides, even when it is done, from the statistical viewpoint a set of available measurements (103 — 104 grains) for the particle number concentration even as small as 1010 — 1018, that is, 0.01% by volume at the particle size 10 nm, is far from being statistically representative. [Pg.461]

From observations in transmission electron micrography (TEM), carbon soot particles are found to have an idealized onion-like shelled structure, as shown in Fig. 14.1.8. Carbon onions varying from 3 to 1000 nm in diameter have been observed experimentally. In an idealized model of a carbon onion, the first shell is a C6o core of /h symmetry, the second shell is C240 (comprising 22 x 60... [Pg.506]

Specialty fixatives, such as Osmium tetroxide, which is used primarily in electron micrography and acetone, is used in fixation of frozen sections. Others used for research purposes on specific tissue, organs or even whole organisms are not discussed in this publication. [Pg.31]

Based on the identification by X-ray diffraction and observation by micrography, the variation was found to be within the non-stoichiometric composition of chalcopyrite in the normal pressure cycle. Despite the decomposition into bornite(Cu FeS ) and pyrrhotite during the reduced pressure cycle, the chalcopyrite was found to be completely restored to its original chalcopyrite form by the succeeding sulfurization. [Pg.359]


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Electron micrography

Micrographis

Micrographis

Micrography, Microscopy

Sample Preparation for Scanning Electron Micrography

Scanning electron micrography

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