Medium - Energy Ion Scattering MEIS

Medium development and feeding, for fermentation, 7 7 25—29 Medium energy dyes, 9 195—196 Medium-energy ion scattering (MEIS), 24 74... 

An independent medium energy ion scattering (MEIS) study of the Cu(lll)(V3xV3)R30°-Sb reached the same conclusion that the surface alloy does involve occupation of hep hollow sites shortly after the original SXRD study [11], while the existence of the stacking fault in the... 

Recent studies which employ diffraction techniques, including medium energy ion scattering (MEIS) (Tromp et al., 1983), LEED (Holland et al., 1984) and grazing incidence X-ray scattering (Jedrecy et al., 1990), favor the asymmetric dimer model in which the top layer dimer is tilted by between 13.3 and 7.6 degrees. However, a kinematic LEED study (Zhao et al., 1991), photoemission studies (Johansson et al., 1990 Uhrberg and Hansson, 1991)... 

Several techniques are usually employed to study the strain in QD layers. Raman spectroscopy and high-resolution X-ray diffraction, on the one hand, can be routinely used to address this issue, but the data obtained are averaged over the entire volume of the dots. High-resolution transmission electron microscopy (HRTEM), on the other hand, provides information at the monolayer scale, but the technique requires extensive sample preparation that may induce an extra relaxation owing to thin foil effects the data gathered are local and may not reflect the structure of the whole sample. Medium energy ion scattering (MEIS) appears as an alternative no preparation is needed. 

Medium-energy ion scattering (MEIS) has been also used to determine the atomic structure of two-dimensional RE sihcides on Si(lll) [lOOj. In the case of the Si(lll)-(1 x 1)-Er, the MEIS results agree with previous findings. Si(lll)-(1 X l)-Ho was found to exhibit a structure similar to the Er 2D silicide. 

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