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Mass spectrometers ToF-SIMS

A few SIMS and SNMS instruments for surface analysis187-189 are commercially available on the analytical market. These are SIMS instruments using a double-focusing sector field mass spectrometer (e.g., CAMECA IMS-7f), time-of-flight secondary ion mass spectrometers (ToF-SIMS IV from CAMECA, Cedex, France, or ToF-SIMS 5, the ToF-SIMS 300 from ION-TOF, Munster, Germany and the PHI TRIFT IV from Physical Electronics, USA) and quadrupole based SIMS (SIMS 4550 and 4600 CAMECA, Cedex, France) or the quadrupole based SNMS instruments with SIMS option (INA-X, SPECS GmbH, Berlin, Germany). [Pg.161]

The time-of-flight secondary ion mass spectroscopy (ToF-SIMS) analysis was performed on a CAMECA ION-TOF Model IV spectrometer. This instrument was equipped with a reflection-type ToF mass analyzer and a pulsed 25 kV primary... [Pg.186]

The application of time-of-flight (TOF) mass spectrometers to SIMS was first reported by Chait and Standing in 1981 [50]. Their instrument used a pulsed alkali metal ion source and a linear flight tube. Steffens et al. developed an im-... [Pg.167]

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface analysis technique used to analyze mass and image constituents that are present on the surface of materials. The equipment (Figure 12.47) uses a pulsed primary ion beam to desorb and ionize species from the sample surface. The resulting secondary ions are accelerated into a mass spectrometer and analyzed by measuring the ToF from the sample surface to the deteetor. The location and distribution of the species on the surface can be identified and an image shown at the detector. The composition is determined from the mass spectrum. Many different primary sources can be used for ionization ... [Pg.489]

Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is an extremely surface-sensitive analytical technique that uses a beam of hquid metal ions to probe the top one to three molecular layers of a sample, causing the emission of ions from the sample to be detected in a time-of-flight mass spectrometer, which gives detailed information about the specific molecules and atoms at a surfiice. [Pg.1778]

Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Measurements. Secondary ion mass spectra were recorded on a PHI 7200 time-of-flight secondary ion mass spectrometer (Physical Electronics, Eden Prairie, MN) in the... [Pg.55]

Time of flight ion probes (TOF SIMS) have unique capabilities not found in other mass spectrometers. A pulsed ion beam, typically either cesium or gallium, ejects atoms and molecules from the sample. Ionized species are accelerated down the flight tube and the arrival time in the detector is recorded, giving the mass of the species (see discussion of time-of-flight mass analyzers above). TOF SIMS instruments used in cosmochemistry have spatial resolutions of <1 pm. They are used to determine elemental abundances in IDPs and Stardust samples. The spatial distribution of elements within a small sample can also be determined. TOF SIMS instruments can obtain good data with very little consumption of sample. [Pg.534]

For quantitative interstellar dust analysis in the sub-pm range, a new secondary neutral mass spectrometer on the basis of a ToF-SIMS has been developed by Henkel et al.u The authors successfully combined a ToF-SIMS based upon the BIOTOF design15 with a laser SNMS to analyze... [Pg.411]


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SIM

SIMS

TOF mass spectromete

TOF mass spectrometer

TOF-SIMS

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