Magnetic force microscopic image

Nishide, H., Ozawa, T., Miyasaka, M. and Tsuchida, E. (2001). Nanometer-sized high-spin polyradical poly(4-phenoxyl-l,2-phenylenevinylene) planarily extended in a non-kekule fashion and its magnetic force microscopic images. J. Am. Chem. Soc. 123, 5942-5946... 

T. Michinobu, N. Sasao, and H. Nishide, Microparticles of poly(methaciylic acid)-gadolinium ion complex and their magnetic force microscopic images, J. Polymer Sci. A, 42,1912-1918 (2004). 

Nanometer-size Multispin Macromolecules and Their Magnetic Force Microscopic Images... 

Magnetic Force Microscopic Images of Magnetically Responsive Macromolecules... 

The magnetic structure in ferromagnetic materials can be imaged by the magnetic version of AFM, the magnetic force microscope, MFM. In this instrument, the cantilever has a ferromagnetic, single-domain tip and... 

Fig. 2.6 Force microscopic images of the polyradical 10 with M = 3.2XIO. (a) (i) AFM, (ii) MFM and (iii) three-dimensional representation of MFM image using the MFM probe magnetized in one direction perpendicular to the sample surface and (b) force microscopic images of 10 under the same conditions except for the use of a probe magnetized in the opposite direction.

A new suspension array concept based on sedimentation and microscopic imaging was introduced by Moser et al. [98], Magnetic microbeads settle to the bottom of a microplate well by magnetic forces and form randomly ordered arrays, which are examined by fluorescence microscopy and automated imaging analysis. Each bead carries specific capture molecules and can be identified by a defined luminescent code. 

The force microscope, in general, has several modes of operation. In the repulsive-force or contact mode, the force is of the order of 1-10 eV/A, or 10 -10 newton, and individual atoms can be imaged. In the attractive-force or noncontact mode, the van der Waals force, the exchange force, the electrostatic force, or magnetic force is detected. The latter does not provide atomic resolution, but important information about the surface is obtained. Those modes comprise different fields in force microscopy, such as electric force microscopy and magnetic force microscopy (Sarid, 1991). Owing to the limited space, we will concentrate on atomic force microscopy, which is STM s next of kin. 

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