Low voltage transmission electron

Delong A, HladU K, Kolarik V. A Low Voltage Transmission Electron Microscope. Eur Microsc Anal 1994 27 13-15. 

In many ways the nanocrystal characterization problem is an ideal one for transmission electron microscopy (TEM). Here, an electron beam is used to image a thin sample in transmission mode [119]. The resolution is a sensitive fimction of the beam voltage and electron optics a low-resolution microscope operating at 100 kV might... 

Transmission electron microscopy (TEM) has traditionally been the mainstay of morphological investigations of polyolefins [8], but recent developments in low voltage high-resolution field emission gun scanning electron microscopy (FEG-SEM) [9] and the advent of atomic force microscopy (AFM) and related near-field techniques [10] have challenged its dominance at the length scales of the order of 10 nm, characteristic of both microdeformation (cavitation, fibrils) and structural components of semicrystalline... 

As SEMs are versatile instruments for relatively low costs, they are largely available in laboratories in the field of biology and materials science. Developed in the 1940 s, it has undergone many changes regarding the ease of use, the electron guns and optics, the resolution improvement and the development of specific modes such as transmission (STEM), low-voltage, environmental or variable-pressure, etc. 

Ultrathin (ca. 100 mn) sections of the polymer, which had been pressed into a sheet, were cut on a Reica Ultracut Microtome equipped with a diamond knife at a low temperature and were then stained with RUO4. TEM observations were made with a Hitachi H-7000 transmission electron microscope at an acceleration voltage of 75 kV and at a magnification of 5,000. 

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