Linear traverse method

Linear traverse methods, which record crystal chord lengths and calculate volume and weight percentages as well as specific surfaces of alite and belite, have recently been used to study clinker thermal history and... 

Figure 6,8 Example of application of the linear traverse method to calculate average mortar intercept.

Bruggemann (1988), using the linear traverse technique for phase abundance, demonstrated that small, lattice defective, alite crystals produced in kilns with steep temperature profiles and short residence times improve grindability and cement quality. Ono s method, utilizing only a few crystals in a powder mount, was said to give doubtful results. ... 

One of the main uses of digital simulation - for some workers, the only application - is for linear sweep (LSV) or cyclic voltammetry (CV). This is more demanding than simulation of step methods, for which the simulation usually spans one observation time unit, whereas in LSV or CV, the characteristic time r used to normalise time with is the time taken to sweep through one dimensionless potential unit (see Sect. 2.4.3) and typically, a sweep traverses around 24 of these units and a cyclic voltammogram twice that many. Thus, the explicit method is not very suitable, requiring rather many steps per unit, but will serve as a simple introduction. Also, the groundwork for the handling of boundary conditions for multispecies simulations is laid here. 

The absorption of radiant energy when a beam of light traverses a solution in a cell of length I is given by = sxlc, where c is the molar concentration of the solution and sx is the molar absorption coefficient at a specified wavelength X (Beer s law). This linear relationship between the absorbance (formerly optical density ) and the concentration forms the basis of innumerable methods for determining the... 

In a reflective cell shown in Figure 9.1, the incident light traverses the linear polarizer, A/4 film, LC layer, and is reflected back by the embedded mirror in the inner side of the rear substrate. In the voltage-off state, the normalized reflectance can be obtained by the Jones matrix method [12] ... 

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