Line imaging

Perhaps the most important features in the images are the dark line images that interconnect adjacent loops. We particularly draw attention to the structure b-b in the expanded image in Fig. 2. Here, the adjacent loops are fairly distinct and well matched on el-... 

X X z location of line center in cm -1 pressure of sample gas multiplied by optical path length distance from center of line image expressed in Rayleigh widths... 

Figure 5.8. STM images of the Si(100)—(2 x 1)—H surface after hydrosilylation reaction using both styrene and allyl mercaptan, from Hossain, Kato and Kawai. The image shown in (a) contains two allyl mercaptan lines. Image (b) shows the system after a new dangling bond is generated using the STM tip. After the surface is exposed to styrene molecules, a styrene line forms which joins the two allyl mercaptan lines (c). The allyl mercaptan lines form across the Si dimer rows, while the styrene line forms along the dimer row. Figure reproduced with permission from Ref. [143]. Copyright 2005 American Chemical Society.

Rowland was the first to rule reflection gratings on concave metal surfaces. Such gratings eliminate the necessity of the spectroscope collimator or focusing lenses, as they take light direct front the spectroscope slit and form the spectral-line images like a concave mirror. The echelon is another special type of grating. 

Figure 9.4 Fiber diffraction patterns from A-DNA (left half of figure) and B-DNA (right). A-DNA was microcrystalline and thus gave discrete, but overlapping, Bragg reflections. B-DNA was noncrystalline and thus gave continous variation in intensity along each layer line. Image kindly provided by Professor Kenneth Holmes.

S. Muerza, H. Berthiaux, S. Massol-Chaudeur, G. Thomas, A dynamic study of static mixing using on-line image analysis, Powder Technol. 128 (2002) 195-204. 

Fig. 16. Example image from the Brijot BIS-WDS Prime that shows a concealed handgun at the front belt line (images courtesy of Brijot Imaging Systems).

Ignoring any near-field correction, the THz line image is reconstructed [1,72] from Eq. 4 using the following formulas... 

Fig. 13. (a) Comparison of a reconstructed line image (solid line) without near-field correction and theoretical image (dashed) for a point source at infinity, (b) Comparison of reconstructed line image (solid line) including... 

Procedure for Examination of Ruled Disk. Since the lines on the ruled disk are straight and not concentric arcs about the center of the rotor, the sharpest image of the lines is obtained with a stationary rotor. The disk in its holder was placed in the rotor, which was coupled to the drive. The correct orientation of the lines, perpendicular to a radius of the rotor, was accomplished by rotating the disk holder to give the sharpest line edges as examined on the monitor in real time (see Figure 3). The camera lens was focused to produce the sharpest line images. 

The line images for the patterns obtained at the two pulse widths were distorted as was shown in Figure 3. However, the quality of the line images in the normalized difference pattern for 725 V (Figure 4c) were as good as those obtained for the unpulsed SIT vidicon. There is only a small amount of increased curvature at the minima on the side of the lines away from the center. The difference patterns for 700 and 750 V (not shown) were more rounded at the minima between the lines, but careful examination provided no improved criteria for their use in determining the optimum focus voltage. 

Figure 4. Magnified line images for ruled disk at sides and center of image, (a) unpulsed (b) 10 psec pulse (c) difference pattern for 8.96-4.48 sec.

If the two mirrors are perfectly orthogonal and L = then the distance of either path to the detector is identical and there would be no observed interference. If, however, L L2, the situation would be the same as interference from a thin film. If the mirrors are slightly offset (not orthogonal), the interference pattern will form a near-straight line image. If the movable mir-... 

Smith, R. W. 1987. Compuer processing of line images a survey. Pattern Recogn. 1 (2) 7—15. 

Cappella, B., et al. (1997), Improvements in AFM imaging of the spatial variation of force-distance curves On-line images, Nanotechnology, 8,82-87. 

In the feature marked C only the c is approximately normal to the electron beam -with the result that white dot features (intralayer pores) are not individually resolved. The image takes on the appearance of repeating white lines along the crystallite layers with a repeat distance half that of the true structure ( white line" image). 

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