Light microscopy raman

Figure 15 Light microscopy image and Raman spectra of an inclusion in PP film. Top, white light micrograph of the inclusion in the PP film. Bottom, Raman spectra, taken at the surface of the PP film (PP) and 12 pm underneath the film surface (inclusion). The spectrum of the inclusion is compared with the reference spectrum of an additive (taken from a supplied reference sample).

A more sophisticated approach uses a stack of serial sections. Three-dimensional images in all forms of light microscopy are built up as serial sections. That is, the microscope (or other device) is focused at different depths through an object, and the resulting stack of images rendered as a three-dimensional object. This technique was introduced into Raman microscopy... 

For overcoming the limit of light microscopy and further improvement in spatial resolution, the implementation of scaiuiing near-held microscopy (SNOM) by means of a local illumination probe is an interesting approach [33-35]. The method is based on the held enhancement in the cavity between a sharp metal dp and the sample. In combination with Raman spectroscopy, this scanning probe technique is called tip-enhanced Raman spectroscopy (TERS) and enables high-resolution spatial microscopy with a lateral resolution of 50 nm [35]. Bouhelier [36] has reviewed advances in this held. 

Atomic defects on carbon nanostructures produced during the fabrication process are typically not reported. Atomic defects are not visible by characterization techniques typically employed such as AFM, SEM, light microscopy and Raman spectroscopy. The atomic structure can be visible by STM [32-35] and TEM [36, 37] but they are tedious and heavily time consuming, and they are typically not employed in the characterization of carbon-based electron nanodevices reported in journal publications. Molecular simulation tools offer an alternative to visualizing and predicting the nanostructure at atomic detail. 

Atomic force microscopy Differential scanning calorimetry X-ray powder diffraction Polarized light microscopy Fourier transform infrared spectroscopy Raman spectroscopy... 

A very wide range of analytical techniques are used to characterize polymer materials (e.g., see references on polymer physics [49], thermal analysis [73,74], light microscopy [75,76], Raman [77, 78], x-ray scattering [79], various spectroscopies [80, 81], and a wide range of microscopy techniques [82]). A text on polymer blends also describes many polymer characterization techniques [83]. Texts on microscopy with a focus on biological materials are often useful for the polymer microscopist (e.g., [84,85]) as the materials have in common a tendency to be soft, to require contrast enhancement, and to suffer from radiation damage in electron beam instruments. The primary characterization of an... 

Hayama, M., Miyasaka, T., Mochizuki, S., Asahara, H., Yamamoto, K.-I., Kohori, R, Tsujioka, K., and Sakai, K. (2003). Optimum dialysis membrane for endotoxin blocking. J. Membr. Sci. 219, 15. Hemsley, D. A. (1989). Basic light microscopy and phase contrast microscopy. In D. A. Hemsley (Ed.), Applied Polymer Light Microscopy. Elsevier Science Publishers, Essex, England, p. 43. Hendra, P. J. (2005). Fourier transform Raman Spectroscopy. In J. J. Lasema (Ed.), Modern Techniques in Raman Spectroscopy. Wiley, Eastbourne, England, pp. 73-106. 

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