Laser interferometric microscopy

In the experiments described here, two separate techniques have been used for interferometric characterization of the shocked material s motion frequency domain interferometry (FDI) [69, 80-81] and ultrafast 2-d spatial interferometric microscopy [82-83]. Frequency domain interferometry was used predominantly in our early experiments designed to measure free surface velocity rise times [70-71]. The present workhorse in the chemical reaction studies presented below is ultrafast interferometric microscopy [82], This method can be schematically represented as in Figure 6. A portion of the 800 nm compressed spectrally-modified pulse from the seeded, chirped pulse amplified Ti sapphire laser system (Spectra Physics) was used to perform interferometry. The remainder of this compressed pulse drives the optical parametric amplifier used to generate tunable fs infrared pulses (see below). 

SIAM Scanning interferometric apertureless microscopy [103b] Laser light is reflected off the substrate, and scattering between an AFM tip and sample is processed interferometrically Diffraction Surface structure... 

In this chapter we explore several aspects of interferometric nonlinear microscopy. Our discussion is limited to methods that employ narrowband laser excitation i.e., interferences in the spectral domain are beyond the scope of this chapter. Phase-controlled spectral interferometry has been used extensively in broadband CARS microspectroscopy (Cui et al. 2006 Dudovich et al. 2002 Kee et al. 2006 Lim et al. 2005 Marks and Boppart 2004 Oron et al. 2003 Vacano et al. 2006), in addition to several applications in SHG (Tang et al. 2006) and two-photon excited fluorescence microscopy (Ando et al. 2002 Chuntonov et al. 2008 Dudovich et al. 2001 Tang et al. 2006). Here, we focus on interferences in the temporal and spatial domains for the purpose of generating new contrast mechanisms in the nonlinear imaging microscope. Special emphasis is given to the CARS technique, because it is sensitive to the phase response of the sample caused by the presence of spectroscopic resonances. 

Bias-induced reverse piezoelectric response Broadband dielectric spectroscopy (BDS) Dielectric permittivity spectrum Dielectric resonance spectroscopy Elastic modulus Ferroelectrets Electrical breakdown Acoustic method Characterization Dynamic coefficient Interferometric method Pressure and frequency dependence of piezoelectric coefficient Profilometer Quasistatic piezoelectric coefficient Stress-strain curves Thermal stability of piezoelectricity Ferroelectric hysteresis Impedance spectroscopy Laser-induced pressure pulse Layer-structure model of ferroelectret Low-field dielectric spectroscopy Nonlinear dielectric spectroscopy Piezoelectrically generated pressure step technique (PPS) Pyroelectric current spectrum Pyroelectric microscopy Pyroelectricity Quasistatic method Scale transform method Scanning pyroelectric microscopy (SPEM) Thermal step teehnique Thermal wave technique Thermal-pulse method Weibull distribution... 

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