Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Scanning interferometric apertureless

SIAM Scanning interferometric apertureless microscopy [103b] Laser light is reflected off the substrate, and scattering between an AFM tip and sample is processed interferometrically Diffraction Surface structure... [Pg.313]

Zenhausem F, Martin Y, Wickramasinghe HK (1995) Scanning interferometric apertureless microscopy-Optical imaging at 10 angstrom resolution. Science 269 1083... [Pg.474]

Zenhausem F, Martin Y and Wickramasinghe H K 1995 Scanning interferometric apertureless microscopy optical imaging at 10 Angstrom resolution Science 269 1083-5... [Pg.2504]

Interferometry is also used to measure beam deflection when making film stress measurements (Sec. 11.5.1). The combination of the AFM and interferometry has produced the scanning interferometric apertureless microscope (SIAM), which has a resolution of about 8 A. [Pg.51]

See other pages where Scanning interferometric apertureless is mentioned: [Pg.247]    [Pg.676]    [Pg.247]    [Pg.676]   


SEARCH



Interferometre

Interferometric

© 2024 chempedia.info