Ion beams for material analysis

J. R. fiiid and J. S. Williams. Ion Beams for Materials Analysis. Academic Press, Australia, 1989. Chapter 3 provides an overview of RfiS, while Chapter 6 reviews channeling techniques. This book also reviews NRA PIXE, SIMS, and other related ion-beam analyses. 

J. R. Bird and J. S. Williams, Ion Beams for Materials Analysis (Academic Press, New York, 1989). 

Cohen DD, Bird R, Dytlewski N and Siegele R (2001) Ion Beams for Material Analysis Encyclopedia of Physical Science and Technology, HI edition Vol. 8 (Academic Press)... 

Ion Beam Handbook for Material Analysis. (J. W. Mayer and E. Rimini, eds.) Academic Press, New York, 1977. This book provides useful tabular and graphic data for RBS, channeling, PIXE, and NRA. 

Mayer, J.W. Rimini, E., Eds. "Ion Beam Handbook for Material Analysis" Academic Press, New York, NY, 1977. 

The principles of ion sources which use a primary ion beam for sputtering of solid material on sample surface in a high vacuum ion source of a secondary ion mass spectrometer or a sputtered neutral mass spectrometer are shown in Figure 2.30a and Figure 2.30b, respectively. Whereas in SIMS the positive or negative secondary ions formed after primary ion bombardment are analyzed, in SNMS the secondary sputtered ions are suppressed by a repeUer voltage and the sputtered neutrals which are post-ionized either in an argon plasma ( plasma SNMS ), by electron impact ionization ( e-beam SNMS ) or laser post-ionization are nsed for the surface analysis (for details of the ionization mechanisms see references 122-124). 

In this introductory chapter, we present the types and main properties of ionizing radiation and general description of its interaction with matter. In addition, taking into account that some other chapters of the present book are dedicated, in particular, to the synthesis of materials using P-particles and y-irradiation, here in the present chapter we will carry out the analysis of examples of more rare application of a-particles, x-rays, neutrons, protons, and ion beams for obtaining various materials, composites, and chemical compounds. 

Bombardment of a sample surface with a primary ion beam followed by mass spectrometry of the emitted secondary ions. Used for the analysis of trace elements in solid materials, continuous erosion by ion beam allows depth analysis... 

Feldman LC and Picraux ST (1977) In Mayer JW and Rimini E (eds.) Ion Beam Handbook for Materials Analysis, ch. 2 and 4. New York Academic Press. 

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