Ion beam alignment

In this Chapter an overview of the state of the art of liquid crystal applications is given, in particular the current market development for LCD s and the recent developments using non contact alignment techniques like photoalignment and ion-beam alignment. 

Figure 2. TOF-SARS spectrum of 4 keV Ar scattering from a GaN 0001 -(1x1) surface with the ion beam aligned along a random azimuthal direction. Incident angle a = 6° Scattering angle 0 = 40°.

Through the use of sequential electric (electrostatic) and magnetic fields (sectors) and various correcting lenses, the ion beam leaving the ion source can be adjusted so that it arrives at the collector in focus and with a rectangular cross-section aligned with the collector slits. For the use of crossed electromagnetic fields. Chapter 25 ( Quadrupole Ion Optics ) should be consulted. 

In addition to elemental compositional information, RBS also can be used to study the structure of single-crystal samples. When a sample is channeled, the rows of atoms in the lattice are aligned parallel to the incident He ion beam. The bombard-... 

RF- and ion-beam assisted PLD PLD chamber equipped with RF or microwave plasma source or ion beam source to enhance the composition of particular film components such as N or O to grow in-plane aligned films on polycrystalline substrates, and to grow nanostructures [128]... 

Crystal size, crystal disorder, and field effect mobility of pentacene films grown on the surface of ion-beam treated and native Si02- Dichroic ratio signifies alignment of pentacene perpendicular to the ion-beam direction. 

MEIS, by contrast, is frequently used to achieve depth profiling information with close to monolayer resolution. The energy of the incident ion beam is in the order of 100 keV. At such energies, the shadow cone radius is relatively small and incident ions are able to channel hundreds of nanometres into the bulk of a crystalline lattice. It is possible, with careful sample alignment, to selectively illuminate a given number of surface layers (see below), in which case one may achieve layer by layer compositional information as a function of depth. 

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