Integrated scattering profile intensity

The intensity, Ihu, scattered by a reciprocal lattice point hkl) corresponds to the integrated intensity of the matching Bragg peak. For simplicity, it is often called intensity . What is actually measured in a powder diffraction experiment is the intensity in different points of the powder pattern and it is commonly known as profile intensity. Profile intensity is usually labeled F/, where / is the sequential point number, normally beginning from the first measured data point (i = 1). 

In principle, aU molecules within the illuminated volume of the solution contribute to Abuik. However, the collection efficiency of scattered photons from molecules in each plane of the solution varies with confocal depth, that is, the distance deviated from the ideally focal plane, where z equals zero and molecules therein contribute the most to the overall intensity, the integrated intensity of which is defined to be /max- Experimentally, a single crystal silicon vrafer immersed in a solution can be used to provide the confocal depth profile. The integrated intensity of the strongest band for Si at 520.6 cm was measured as the Si wafer plane was moved up and down vertically, while the confocal position was kept stationary. Fig. 29(c) presents the intensity-distance profile that simulated the confocal depth profile, see the solid line. It shows an abrupt decrease at both sides of the ideally focused plane. 

For a quantitative evaluation of oriented and isotropic parts of the total scattered intensities, the respective 2D WAXS patterns were integrated in the 0 to 180 range to get the ID WAXS profiles, which were afterwards fitted by Gaussian peaks. The results from peak-fitting applied in the 80/20/0 MFC sample are presented in Figure 14.29(a) and (b). The deconvolution of the integral profile of the oriented part clearly shows the (110), (200) and (210) contributions of the HDPE (Figure 14.29(a), the shaded reflections) and also... 

When the vector properties of the scattered fragments are correlated, both the integrated intensities and the resolved Doppler profiles are profoundly sensitive to changes in the relative directors and polarisations of the photolysis (1, p) and probe/analysis (ka, j ) laser beams and to the nature of the probed transition, P, Rt or Qt. Alternative quantal and classical procedures for relating the observed changes to the vector correlations have been developed by Dixon [6] and by Houston and his co-workers [47,49] and these have already been used to andyse the photodissociation dynamics in H2O2 [21,22,23], SCO [48,50], (HCO)2 HNO3 [23], NNO... 

The diffraction patterns are analysed by standard refinement methods developed for X-ray scattering one determines the atom position inside the unit-cell which gives the best fit between the experimental and the calculated spectrum. In the Rietveld method [11], the fit is done on the complete line profiles if the resolution of the spectrometer is not well known, or if the Bragg peaks are broadened for physical reasons, then only the integrated intensities of each peak can be used. 

Then, the total integrated intensity (area] of the corrected diffractogram is separated into area of non-crystalline (nc] and area of crystalline (cr] scattering (Fig. 7.5]. For this purpose, similar transfer the profile of amorphous standard was carried out. 

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