Instrumentation improving image resolution with

Aberration corrected electron microscopes are now widely available and resolutions of 0.05 nm are possible in the latest instruments. For many bulk systems the accuracy of atomic scale structural characterisation is no longer determined by the microscope but by the difficulty of preparing a suitable thin representative specimen. In contrast, nanoparticle systems are inherently nano-sized and in combination with the use of novel 2D crystals as ultra thin supports,are ideally suited to exploit the full potential of the latest microscopes. Advances in TEM image resolution have stimulated complementary improvements of associated instrumentation including high brightness electron sources, stable power supplies and large... 

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