Instrumental profile effect

The effect of instrumental broadening can be eliminated by deconvolution (see p. 38) of the instrumental profile from the measured spectrum. If deconvolution shall be avoided one can make assumptions on the type19 of both the instrumental profile and of the remnant line profile. In this case the deconvolution can be carried out analytically, and the result is an algebraic relation between the integral breadths of instrumental and ideal peak profile. From such a relation a linearizing plot can be found (e.g., measured peak breadths vs. peak position ) in which the instrumental breadth effect can be eliminated (Sect. 8.2.5.8). 

In their simplest form, radiometers monitor irradiance (in W/cm ) and radiant energy density (in J/cm ) for the bandwidth of the instrument. Profiling radiometers can in addition to that also provide irradiance profiles as a function of time. The results from the monitoring of a process can be effectively used to correlate exposure conditions to the physical properties of the cured product. If needed, they can also become the specifications of exposure in the design of production systems. Usually, radiometers are placed in the same position as the material that is being cured. 

In many cases, the profile a spectroscopist sees is just the instrumental profile, but not the profile emitted by the source. In the simplest case (geometric optics, matched slits), this is a triangular slit function, but diffraction effects by beam limiting apertures, lens (or mirror) aberrations, poor alignment of the spectroscopic apparatus, etc., do often significantly modify the triangular function, especially if high resolution is employed. 

There are two different approaches for calculation of the instrumental function. The first is the convolution approach. Proposed more than 50 years ago, initially to describe the observed profile as a convolution of the instrumental and physical profiles, it was extended for the description of the instrumental profile by itself According to this approach the total instrumental profile is assumed to be the convolution of the specific instrumental functions. Representation of the total instrumental function as a convolution is based on the supposition that specific instrumental functions are completely independent. The specific instrumental functions for equatorial aberrations (caused by finite width of the source, sample, deviation of the sample surface from the focusing circle, deviation of the sample surface from its ideal position), axial aberration (finite length of the source, sample, receiving slit, and restriction on the axial divergence due to the Soller slits), and absorption were introduced. For the main contributors to the asymmetry - axial aberration and effect of the sample transparency - the derived (half)-analytical functions for corresponding specific functions are based on approximations. These aberrations are being studied intensively (see reviews refs. 46 and 47). 

The inverse proportionality between peak width and mean size stated by the Scherrer equation places practical limits to the range of domain sizes that produce measurable effects in a powder pattern. While the lower bound [a few ( 2)nm, depending on the specific phase] is related to the approximations used, the upper bound depends on the instrumental resolution, i.e. on the width of the instrumental profile. Traditional laboratory powder diffractometers, using standard commercial optics, typically allow the detection of domain sizes up to 200 run. Above this value, domain size effects can hardly be distinguished from the instrumental broadening. This limit, however, can considerably be extended by using suitable high resolution optics, as is the case of many diffractometers in use with synchrotron radiation. In this case the practical limit can reach several micrometres. 

In conclusion, the capacitive mass flowmeter can be a reliable instrument for measuring the flow of dilute suspended solids. For the flow of high concentrations of suspended solids, the velocity measurement becomes inaccurate. The inaccuracy may be caused by the velocity profile effect, but further study is required to confirm the observation. 

When analysis is performed on ion-trap instruments, this ion can be selected and subjected to further fragmentation. The resulting MS spectra are rich in structural information (Figure 2.15). The MS/MS spectra on tandem quadrupole or Q-TOF instruments are effectively a composite of MS2 and MS3 spectra recorded on an ion trap. Using our charge-tagging methodology, we have profiled the oxysterol content of adult, newborn, and... 

A perturbative approach to Eq. (12) has recently been developed by Gomez-Monivas et al. [37]. For a dielectric film on top of a flat metallic surface, these authors find that the electrostatic force is a convolution of the instrumental resolution with an effective profile... 

It is a known property of Fourier transforms that given a convolution product in the reciprocal space, it becomes a simple product of the Fourier transforms of each term in the real space. Then, as the peak broadening is due to the convolution of size and strains (and instrumental) effects, the Fourier transform A 1) of the peak profile I s) is [36] ... 

The diffraction lines due to the crystalline phases in the samples are modeled using the unit cell symmetry and size, in order to determine the Bragg peak positions 0q. Peak intensities (peak areas) are calculated according to the structure factors Fo (which depend on the unit cell composition, the atomic positions and the thermal factors). Peak shapes are described by some profile functions 0(2fi—2fio) (usually pseudo-Voigt and Pearson VII). Effects due to instrumental aberrations, uniform strain and preferred orientations and anisotropic broadening can be taken into account. 

Because these analysers do not employ magnets, peak switching for selected ion monitoring can be done more quickly without hysteresis effects, which makes this system ideal for depth profiling, where it is necessary constantly to switch among masses. These instruments do have the disadvantage of loss of transmission and mass... 

By means of LIMS the reliability of the tests, the traceability of the results, and the security of the data can be guaranteed. In addition, the effectivity of the costs may be estimated and supply, service and maintenance of instruments managed. LIMS always has to be designed in an individual way according to its specific profile. Information on LIMS can be found mainly on the internet (see Limsource, Lapitajs and Klinkner, etc.). 

A plot of the anthracene fluorescence intensity at 425 nm as a function of the reaction time is shown in Figure 2. Again, this figure exhibits the effect of the instrumental artifact in the initial fluorescence data however, examination of the final 90% of the profile reveals that the anthracene concentration profile closely follows a first order exponential decay. Although the photosensitization reaction is bimolecular, the anthracene concentration follows a pseudo-first-order profile since the initiator is present in excess (i.e. r = = kjCA where r, Q and CA represent... 

Soils develop by the action of the soil forming factors on soil parent materials including material transported by different agents. The result of these soil forming factors is the formation of soil horizons, different colors, and peds. Each of these factors has a pronounced effect on a soil s chemistry. Knowledge of the soil type and profile description can provide the soil chemist, analyst, or researcher with valuable information about the characteristics of soil relevant to the development of extraction, analytical, and instrumental analytical procedures. It also is the place to start when investigating the failure of a procedure. 

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