Image visualizations rasterization

If the analyzer is set to accept electrons of an energy characteristic of a particular element, and if the incident X-ray beam is rastered over the surface to be analyzed, a visual display the intensity of which is modulated by the peak intensity will correspond to the distribution of that element over the surface. The result is also an image and this technique is realized with the Quantum 2000. 

In order to use a mass spectrometer as an imaging instrument, it is necessary for the mass spectrometer to be equipped with a rastering function, which allows the sample (or the laser beam) to be rastered in a precise manner to move the laser beam across the tissue surface. A sophisticated data acquisition system is necessary to handle the large amount of data acquired during analysis, and visualization software is essential to create images from the ion intensities of selected ions. Several commercial mass spectrometric imaging instruments are now available with these features. Almost all manufacturers have developed in-house software and have included methods for instrument and image reconstruction, but there are some noncommercial products as well. 

The PUs microstructure can be also investigated by means of atomic force microscopy (AFM). Phase images obtained via AFM, enable visual representation of the PUs microphase separated morphology. AFM records the surface topography of materials by measuring attractive or repulsive forces between the probe and the sample. Vertical deflections caused by surface variations are monitored as a raster scan drugs a fine tip over the sample. A detailed description of different modes in AFM technology has been described in [195]. 

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