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Film Morphology and Structure

In order to get more insight into the eoneentration dependent electron and hole mobility, structure and morphology of neat and mixed films (evaporated at 375 K) were investigated by X-ray diffraction and scanning force microscopy. [Pg.357]

This film shows a low root mean square roughness (RMS) of only 2.2 nm. [Pg.357]


Chandra and Avedisian 411] studied the collision dynamics of a liquid (n-heptane) droplet on a polished, solid, stainless steel surface, and on a liquid film created by deposition of a preceding droplet using a flash photographic method. They presented a comprehensive series of clear images of droplet shape, morphology, and structure during the deformation process. In their experiments, the... [Pg.218]

Recently, Foo et al. (2006) produced some novel nanocomposites from spider silk-silica fusion (chimeric) proteins. The composite morphology and structure could be regulated by controlling processing conditions to produce films and fibers. Silk and biomineralization being natural inspiration sources will allow production of numerous new materials in various fields of application. [Pg.147]

Fig. 9. Model for time-dependent morphological and structural changes in the one-layer LB film of pentadecyl-TCNQ. (Reproduced with permission from Ref. [34], Copyright (2000) American Chemical Society.)... Fig. 9. Model for time-dependent morphological and structural changes in the one-layer LB film of pentadecyl-TCNQ. (Reproduced with permission from Ref. [34], Copyright (2000) American Chemical Society.)...
Figure 1 Morphology and structure of a low adhesion (100 g/inch) aluminum film evaporated on non treated bi-axially stretched PET.(marked is 100 nm)... Figure 1 Morphology and structure of a low adhesion (100 g/inch) aluminum film evaporated on non treated bi-axially stretched PET.(marked is 100 nm)...
The same morphology was observed on all the membranes obtained on the a-alumina (Figs. 2 and 3). Nickelsilicate films obtained on a-A Oa have a typical morphology and structure for MCM-41 materials (Figs. 2 and 3), but the thickness is higher compared to the membranes synthesized on 7-alumina disk. A difference in the morphology between outer and inner sides of the film was observed for all the membranes (Fig. 3a). It has to noted that the particle size of outer layers is much smaller than that of inner layers. [Pg.70]

Figure 11.10 Morphology and structure of thin pentacene films on a SAM pre-covered Au(l 11) substrate (a) SEM micrograph of a 2 nm film together with corresponding STM data (b), (c) showing a layered arrangement of upright standing molecules. XRD data recorded for a 30 nm film (d) clearly reveal the presence of (001) oriented films revealing the thin film phase while at larger thickness the bulk phase is adopted. Figure 11.10 Morphology and structure of thin pentacene films on a SAM pre-covered Au(l 11) substrate (a) SEM micrograph of a 2 nm film together with corresponding STM data (b), (c) showing a layered arrangement of upright standing molecules. XRD data recorded for a 30 nm film (d) clearly reveal the presence of (001) oriented films revealing the thin film phase while at larger thickness the bulk phase is adopted.
Knipp, D. et ah, Pentacene thin film transistors on inorganic dielectrics Morphology, structural properties, and electronic transport, J. Appl. Phys. 93, 347-355, 2003. Jentzsch, T. et ah, Efficiency of optical second harmonic generation from pentacene films of different morphology and structure. Thin Solid Films 315, 273-280, 1998. Knipp, D., Street, R.A., and Volkel, A.R., Morphology and electronic transport of polycrystalline pentacene thin-fihn transistors, AppZ. Phys. Lett. 82, 3907-3909, 2003. Mattheus, C.C. et ah, Identification of polymorphs of pentacene, Synth. Met. 138, 475-481, 2003. [Pg.334]

The knowledge of chemically deposited films, from a morphological and structural point of view, requires determination of different characteristics roughness at different scales, nature of the crystallographic structure, existence of textures, nature and density of crystallographic defects like dislocations, stacking faults, twins, etc. such characteristics depend on numerous parameters and are the consequence of the nucleation and growth mechanism. [Pg.201]

J. Aarik, A. Aidla, T. Uustare, V. Sammelselg, Morphology and structure of Ti02 thin films grown hy atomic layer deposition . Journal of Crystal Growth, 148, 268-275, (1995). [Pg.175]

Sample preparation parameters, such as film structure, film morphology, and so forth, can determine the gas sensing properties. A smooth film with small grains generally presents a fast response and a high sensitivity. To be used in a gas sensor. [Pg.74]


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