Field effect scanning electron microscopy

Electron microscopy uses several available electronic microscopy techniques to view the top or cross-sections of membranes scanning electron microscopy (SEM), transmission electron microscopy (TEM), field effect scanning electron microscopy (FESEM), etc. The corresponding images are analyzed to obtain pore size distributions [9] (see Chapter 3). 

Microscopical methods. These methods include several electronic microscopy techniques such as SEM (scanning electron microscopy), TEM (transmission electron microscopy), FESEM (field effect scanning electron microscopy), etc. Also, scamiing probe techniques such as AFM (atomic-force microscopy) and STM (scamiing tunneling microscopy) could be included in this group. 

Figure 38.3 shows field emission scanning electron microscopy (FE-SEM) images of Ni/NiO nanoparticles prepared at different pressures and carrier gas flow rates. It was found that the particle size generally increased as the residence time increased. With an identical residence time, 40 Torr, there was a total carrier gas flow rate of 1 L/min, while at 80 Torr the total carrier gas flow rate was 2 L/min. However, particles formed in the latter case were bigger. Carrier gas flow rate also played a role in controlling particle size, as shown by the difference in particle size at the same pressure but with a different carrier gas flow rate. The effect of pressure played a more important role than the residence time (Fig. 38.3a, d). 

The properties of developed electrospun nanofibers are key issues for then-applications in industry. Here, the structure and morphology of the nanofibers were characterized by field emission scanning electron microscopy, transmission electron microscopy. X-ray powder diffraction, and their electromagnetic interference shielding effectiveness and magnetic property were also evaluated for electromagnetic shielding applications. 

Fein, A.P. J. Vac. Sci. Technol. A. in press)(3). Electronic structure measurements of occupied states are typically made with UPS, while unoccupied states are probed by IPS (49). EELS probes both filled and unfilled states simultaneously, and is therefore used in conjunction with either UPS or IPS to complete a band structure determination (44,49). A new electronic spectroscopy technique, Field Emission Scanning Auger Microscopy (50), utilizes STM-like technology to effect highly localized (c.a. 1 /im) Auger electron spectroscopy. The local electronic information afforded by STM is a valuable complement to these other techniques, and STM is the only one of these methods that may be applied to in situ investigations in condensed media. 

SCBD SCP SEM SOJT STM supersonic carbon cluster beam deposition self consistent field scanning electron microscope second-order Jahn-Teller effect scanning tunneling microscopy... 

Scanning electron microscopy (SEM) scans over a sample surface with a probe of electrons (5-SO kV). Electrons (and photons), backscattered or emitted, produce an image on a cathode-ray tube, scanned synchronously with the beam. Magnification of 20-50,000 are possible with a resolution of about 5 nm. There is a very high depth of field and highly irregular structures are revealed with a three-dimensional effect. 

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