Fatigue Damage Under Wide-Band Random Processes

3 Fatigue Damage Under Wide-Band Random Processes 

Note that k is the slope of the S-N curve defined in Eq. (5.22), and 2 is the spectral width parameter defined in Eq. (8.2a). There is another expression for the correction factor (o to be used with the narrow-band damage Dffg due to Oritz and Chen [34] based on the moments of PSD (see Sect. 8.5.2) that is 

Instead of using the damage correction factor to shift from the narrow-band approach to the wide-band method, Dirlik [35] developed in 1985 an approach based on extensive Monte Carlo simulations of the stress amphtudes, option B in Fig. 8.38. Dirlik s solutions were successfully verified by Bishop [36] in theory. Dirlik s damage model for a time period of T is as follows 

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