Energy dispersive x-ray spectrometry EDX

An elemental analysis of the anodic films performed both with AES and SEM energy-dispersive X-ray spectrometry (EDXS) showed that the films had 11 at. % average deviation from the starting material stoichiometry towards carbon enrichment, and contained 6 at.% of oxygen and 9 at.% of fluorine. Also, current-voltage (I-V) measurements of the speci-men/electrolyte junction (performed under illumination) before and after the treatment revealed enhancement of photoresponse from the SiC surface covered with the anodic film as compared with the starting material. 

Optical microscopy (OM), polarized light microscopy (PLM), phase contrast microscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and scanning transmission electron microscopy (STEM) are the methods normally used for identification and quantification of the trace amounts of asbestos fibers that are encountered in the environment and lung tissue. Energy-dispersive X-ray spectrometry (EDXS) is used in both SEM and TEM for chemical analysis of individual particles, while selected-area electron diffraction (SAED) pattern analysis in TEM can provide details of the cell unit of individual particles of mass down to 10 g. It helps to differentiate between antigorite and chrysotile. Secondary ion mass spectrometry, laser microprobe mass spectrometry (EMMS), electron probe X-ray microanalysis (EPXMA), and X-ray photoelectron spectroscopy (XPS) are also analytical techniques used for asbestos chemical characterization. 

FIGURE 8.3 SEM images of platelet carbon nanofibers film, (a) SEM image of PCNFs film (b) Energy dispersive X-ray spectrometry (EDXS) of a light particles (indicated by A in (a)) on the top of a fiber, (c) The size of a typical PCNFs, which shows the width (100-300 nm) and thick (30 nm) of the fiber (d) surface morphology of a PCNF. 

MS), nuclear magnetic resonance (NMR), or energy dispersive x-ray spectrometry (EDX or EDS). 

Samples were characterized by N2 adsorption-desorption isotherms at 77 K, scanning electron microscopy (SEM), transmission electron microscopy (TEM), energy-dispersive X-ray spectrometry (EDXS), selected area electron dif action (SAED) and X-ray diffraction (XRD). Further details of the experimental procedrrres are described elsewhere [9]. 

In order to individually analyze the fluorescent X-rays from each element, the spectral separation of the X-rays is required. There are two types of spectrographic methods for XRF. They are wavelength dispersive X-ray spectrometry (WDS, WDX) and energy dispersive X-ray spectrometry (EDS, EDX). The characteristics of WDS and EDS are shown in Table 1. Please refer to the following reference for more detailed explanations of XRF [1]. 

Chemical features determined by analysis of elements in human hair are helpful for hair comparisons. Analysis of elements in the hair has been accomplished by instrumental methods such as atomic absorption spectrometry, neutron activation analysis, energy dispersive X-ray microanalysis (EDX). Among them, EDX equipped with scanning electron microscopy is widely used in forensic hair examination because it facilitates easy analysis of elements whilst observing the hair structure. 

Scanning electron microscopy and energy dispersive X-ray spectrometry (SEM/EDS or SEM/EDX) is the... 

The most frequently applied analytical methods used for characterizing bulk and layered systems (wafers and layers for microelectronics see the example in the schematic on the right-hand side) are summarized in Figure 9.4. Besides mass spectrometric techniques there are a multitude of alternative powerful analytical techniques for characterizing such multi-layered systems. The analytical methods used for determining trace and ultratrace elements in, for example, high purity materials for microelectronic applications include AAS (atomic absorption spectrometry), XRF (X-ray fluorescence analysis), ICP-OES (optical emission spectroscopy with inductively coupled plasma), NAA (neutron activation analysis) and others. For the characterization of layered systems or for the determination of surface contamination, XPS (X-ray photon electron spectroscopy), SEM-EDX (secondary electron microscopy combined with energy disperse X-ray analysis) and... 

E E(t) EDM EDTA EDX EHD EKI EO EOF ESI-MS Ez Activation energy Exit-age distribution function Electro-discharge machining Ethylene-diamine-tetraacetic acid Energy dispersive X-ray Electrohydrodynamic Electrokinetic instability Electroosmotic-Electroosmotic flow Electrospray ionization mass spectrometry Electric field... 

Analysis of Composition of the Polymer and Additives Infrared Spectroscopy (IR), Energy Dispersive X-Ray Spectroscopy (SEM-EDX), Mass Spectrometry (MS), Gas Chromatography (GC), Nuclear Magnetic Resonance NMR)... 

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