Elemental depth profile, plasma

SNMS is suitable for quantitative element depth profiling of metallic and electrically insulating samples. Laser-SNMS enables the additional acquisition of 2D element distributions with HF-plasma SNMS bulk analysis is also feasible. 

Figure 7. Elemental depth profile after one hour plasma treatment of nylon 6/7.5% layered silicate nanocomposites. (1. oxygen, 2. silicon, 3. aluminum, 4.

Depth profile of elements in seawater near hydrothermal vents. [From T. Akagi and H. Haraguchi, Simultaneous Multielement Determination of Trace Metals Using W mL of Seawater by Inductively Coupled Plasma Atomic Emission Spectrometry with Gallium Coprecipitation and Microsampling Technique Anal. Chem. 1990, 62.81.]... 

Figure 31.2 Mg 2p spectra from depth profiles showing Mg migration into the oxide layer due to heating during extended plasma pretreatments the three samples are a) the native acetone cleaned surface, b) alkaline cleaned and deoxidized, and c) alkaline cleaned and deoxidized followed by 10 min of Ar + H2 plasma treatment and 10 min of N2 plasma treatment prior to deposition of a plasma polymer from TMS + N2, the arrow indicates the evolution as a function of sputtering time, but spacing between spectra is not linear but rather a spectral index, the lines mark the different regions on the samples, as obtained from spectra of the other constituent elements.

Chemically modified celluloses have been analyzed by conventional wet methods and by various Instrumental methods designed to differentiate bulk and surface properties. Electron emission spectroscopy for chemical analyses (ESCA) used alone and In combination with radiofrequency cold plasmas yielded elemental analyses, oxidative states of the element, and distribution of the element. Techniques of electron paramagnetic resonance (EPR), chemiluminescence, reflectance infrared spectroscopy, electron microscopy, and energy dispersive X-ray analyses were also used to detect species on surfaces and to obtain depth profiles of a given reagent in chemically modified cottons. 

SNMS Spulleied Neutral Mass Spectroscopy Surface, bulk Plasma discharge noble gases 0.5-20 keV Sputtered atoms ioni by atoms or electrons then mass analyzed 0.1-0.5 nm (or deeper ion milling) 1 cm Elemental analysis Z > 3 depth profile detection limit ppm 4,6... 

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