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Electronic assemblies acceleration factor

While this method of testing is still being refined, it has been demonstrated to simulate accurately the deposition of fine-particle dust as found in forced-air cooled electronic equipment. The resulting electrical effects on circuit boards and equipment assemblies are comparable to those found in field environments. The acceleration factor for fine-particle deposition is about 200, depending on the surface area and configuration of the equipment that is undergoing test. [Pg.1016]


See other pages where Electronic assemblies acceleration factor is mentioned: [Pg.354]    [Pg.374]    [Pg.285]    [Pg.287]    [Pg.508]    [Pg.5]    [Pg.196]    [Pg.904]    [Pg.904]    [Pg.374]    [Pg.306]    [Pg.70]    [Pg.769]   
See also in sourсe #XX -- [ Pg.772 ]




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