Electron Probe Microanalysis corrections

Quantitative Electron-Probe Microanalysis. (V. D. Scott and G. Love, eds.) John Wiley Sons, New York, 1983. Taken from a short course on the electron microprobe for scientists working in the field. A thorough discussion of EDS and WDS is given, including experimental conditions and specimen requirements. The ZAF correction factors are treated extensively, and statistics, computer programs and Monte Carlo methods are explained in detail. Generally, a very useftd book. 

Rarely will it be possible to draw conclusions directly from the raw data of analytical measurements and it is usual for some refinement of the data to be carried out. In its simplest form this could merely comprise background corrections, but it is often much more complex, requiring corrections for a number of factors as in mass spectrometry, X-ray fluorescence and electron probe microanalysis. More complex routines made available by computers include spectrum smoothing, stripping one component from a spectrum or making peak area measurements from chromatograms. 

Armstrong JT (1984) Qnantitative analysis of sihcate and oxide minerals a reevaluation of ZAF corrections and proposal for new Bence-Albee coefficients. Microbeam Anal-1984 19 208-212 Bastin GF, vanLoo FJJ, Heijhgers HIM (1984) An evaluation of the use of Gaussian prz curves in quantitative electron probe microanalysis. X-Ray Spectrom 13 91-97 Bea F, Montero P (1999) Behavior of accessory ph e and redistribution of Zr, REE, Y, Th, and U during metamorphism and partial melting of metapelites in the lower cmst an example from the Kinzigite Formation of Ivrea-Verbano, NW Italy. Geochim Cosmochim Acta 63 1133-1153... 

Sewell DA, Love G, Scott VD (1985) Utriversal correction procedure for electron-probe microanalysis. I. Measurement of X-ray depth-distributions in solids. J Phys D 18 1233-1243... 

Williams ML, Jercinovic MJ, Terry MP (1999) Age mapping and dating of monazite on the electron microprobe deconvoluting multistage tectonic histories. Geology 27 1023-1026 Yakowitz H, Heinrich KFJ (1968) Quantitative electron probe microanalysis absorption correction uncertainty. Mikrochim Acta 1968 182-200... 

K. F. J. Heinrich, Errors in theoretical correction systems in quantitative electron probe microanalysis—synopsis. Anal. Chem. 44, 350-354 (1972). 

X-ray microanalysis is a local analysis, fulfilled by means of microanalyser electron probe, for sample sites of 1-3 pm. The electron probe is formed by electrostatic and magnetic fields to obtain a parallel electron beam with a diameter of --1 pm. The analysis is via primary X-ray sample emission which is spread out into a spectrum by means of X-ray spectrometer. In this method corrections for the atomic number of the element, the absorption of its radiation in the sample, its fluorescence, and the characteristic spectra of other elements contained in the sample must be accounted for. Microanalysis is used for the investigation of two- and three-component systems such as mutual diffusion, crystallization processes, local variations of alloy structure, etc. 

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