Transmitted electron micrograph

Fig. 9. A transmitted electron micrograph of an ultramicrotomed section of an aluminum-epoxy interphase. The highly ordered structure in the center is a 3.3 micron thick aluminum oxide layer present on the base metal. The featureless area is the epoxy matrix. The light areas within the oxide are fractures caused by the microtoming. The epoxy has however penetrated to the bottom of all of the 50 nm pores in the oxide...

Figure 2.13. Scanning electron micrograph of images printed in a DQN resist by using narrow bandwidth 436 nm) light. The regular pattern of indentations on the side wall results from the standing wave interference of the light transmitted through the resist and that reflected from the resist-substrate interface.

Figure 5, Transmitted electron micrograph of semicoke from Lower Kittanning coal after heating to 500°C,...

The calculation of the diffraction pattern for a periodic system revolves around the construction of the reciprocal lattice and subsequent placement of the first Brillouin zone however, in this case the aperiodicity of the pentagonal array requires a different approach due to the lack of translational symmetry. The reciprocal lattice of such an array is densely filled with reciprocal lattice vectors, with the consequence that the wave vector of a transmitted/reflected light beam encounters many diffraction paths. The resultant replay fields can be accurately calculated by taking the FT of the holograms. To perform the 2D fast Fourier transform (FFT) of the quasi-crystalline nanotube array, a normal scanning electron micrograph was taken, as shown in Fig. 1.13. 

Electron Microscopy The sample preparation was based on Kato s (10) osmium tetroxide staining technique and a two-step sectioning method. The specimens were exposed to O5O4 vapor and cut with a LKB ultratome III to get a 0.1 y slice. The electron micrographs were taken with an AEI 6B and a Phillips 300 transmitting electron microscope with a magnification of 95,000. 

The distance between conductive fillers is of great importance for electric conduction in the filled conductive polymer composite. It is widely accepted that the electrons can transmit or jump between the conductive fillers in the presence of an electric field, even if there is a gap between the fillers. However, this gap cannot be too large and is usually accepted to be lower than 10 nm. Thus, the distance between the outmost CB particles in one microfibril and those in another microfibril is a crucial factor for electric conduction between two microfibrils. Figure 13.5 shows the SEM micrographs of the cryofractured... 

Studies by optical microscopy of the material left after evaporating the benzene show a variety of what appear to be crystals—mainly rods, platelets and star-like flakes. Figure 1 shows a micrograph of such an assemblage. All crystals tend to exhibit six-fold symmetry. In transmitted light they appear red to brown in colour in reflected light the larger crystals have a metallic appearance whereas the platelets show interference colours. The platelets can be rather thin and are thus ideally suited for electron-diffraction studies in an electron microscope (see the inset in Fig. 3). 

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