Electron energy loss spectroscopy characteristics

AES = auger electron spectroscopy APS = appearance potential spectroscopy CEELS = characteristic electron energy-loss spectroscopy ... 

In order to elucidate the results of the CO TPD experiment, the detailed structure of the oxygen-modified Mo(l 12) surfaces and the adsorption sites of CO on these surfaces have been considered. Zaera et al. (14) investigated the CO adsorption on the Mo(l 10) surface by high-resolution electron-energy-loss spectroscopy (HREELS) and found vatop sites. Francy et al. (75) also found a 2100 cm loss for CO on W(IOO) and assigned it to atop CO. Recently, He et al. (16) indicated by infrared reflection-absorption spectroscopy that at low exposures CO is likely bound to the substrate with the C-0 axis tilted with respect to the surface normal. They, however, have also shown that CO molecules adsorbed on O-modified Mo(l 10) exhibi Vc-o 2062 and 1983 cm L characteristic to CO adsorbed on atop sites. Thus it is supposed that CO adsorbs on top of the first layer Mo atoms. 

In the EXAFS and Electron Energy Loss Spectroscopy (EELS) spectra [11] show no trace of Co oxide, however XAS spectra of the smallest particles present characteristic peaks of CoO bonds in the L3 contribution. The fraction of Co bonded to oxygen atoms is proportional to the fraction of paramagnetic atoms, or very small clusters. However, for (d > 2 nm this... 

CEELS. Abbreviation for characteristic electron energy-loss spectroscopy. 

The physical properties of carbon onions clearly demonstrate their relationship with fullerenes and multiwalled nanotubes. They exhibit characteristic signals in their Raman and IR-spectrum, and electron energy loss spectroscopy provides important information on the stracture of the ir-electron system. 

From examining the spectroscopic characteristics of diamond films, many insights into their structure may be obtained. Most of all the Raman spectroscopy, XRD and electron energy loss spectroscopy (EELS) provide valuable information. Other methods like IR-spectroscopy and XPS shed light on the surface structure. These techniques are supplemented by microscopy methods, for example, by AFM and STM, so altogether the morphology of the films surface can be studied in quite some detail. 

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