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Electron diffraction, elastic

E. Other techniques Low-energy electron diffraction Elastic low-energy electron diffraction Inelastic low-energy electron diffraction Reflection high-energy electron diffraction LEED ELEED ILEED RHEED 50 A Crystalline surface structure Limited applicability 128, 129, 130... [Pg.386]

HEED High-energy electron diffraction [104] Diffraction of elastically back-scattered electrons (-20 keV, grazing incidence) Surface structure... [Pg.313]

LEED Low-energy electron diffraction [62, 75, 105] Elastic backscattering of electrons (10-200 eV) Surface structure... [Pg.313]

Electrons interact with solid surfaces by elastic and inelastic scattering, and these interactions are employed in electron spectroscopy. For example, electrons that elastically scatter will diffract from a single-crystal lattice. The diffraction pattern can be used as a means of stnictural detenuination, as in FEED. Electrons scatter inelastically by inducing electronic and vibrational excitations in the surface region. These losses fonu the basis of electron energy loss spectroscopy (EELS). An incident electron can also knock out an iimer-shell, or core, electron from an atom in the solid that will, in turn, initiate an Auger process. Electrons can also be used to induce stimulated desorption, as described in section Al.7.5.6. [Pg.305]

When high-energy electrons are injected into thin specimen, most of them tend to pass through without any perturbation occurring from the substances, because the cross section of atomic nuclei is small enough to such electrons. Some of the incident electrons are elastically scattered to be diffracted, and the others... [Pg.31]

Figure 9-7. Elastic electron-diffraction pattern of a highly textured hcxaphenyl film. The Miller indices arc assigned using the intcrplauar spacings calculated in Kef. 11371. Inset Intensity of the f020) peak as a function of the angle between momentum transfer and the Teflon rubbing direction (see text) - taken from Ref. 138. ... Figure 9-7. Elastic electron-diffraction pattern of a highly textured hcxaphenyl film. The Miller indices arc assigned using the intcrplauar spacings calculated in Kef. 11371. Inset Intensity of the f020) peak as a function of the angle between momentum transfer and the Teflon rubbing direction (see text) - taken from Ref. 138. ...
In summary, the movement of a high-energy electron in a solid may be described by a set of three Equations (1), (4) and (6). From these equations we may conclude that for high-energy electron diffraction the problem of multiple elastic and inelastic scattering by a solid is entirely determined by two functions, i.e. (1) the Coulomb interaction potential averaged over the motion of the crystal particles (V(r)> and (2) the mixed dynamic form factor S(r, r, E) of inelastic excitations of the solid. [Pg.162]

Z.L. Wang, Elastic and Inelastic Scattering in Electron Diffraction and Imaging, Plenum, New York (1995)... [Pg.167]

Many such techniques have been developed and used. Low-Energy Electron Diffraction, in which electrons are elastically scattered off a surface, has been the most successful among those for surface crystallography. Inelastically scattered electrons also... [Pg.22]

Roughly 1 to 5% of the incoming electrons are elastically scattered and this fraction is allowed to impinge on a fluorescent screen. If the crystal surface is well-ordered, the diffraction pattern consisting of bright, well-defined spots will be displayed on the screen. The sharpness and overall intensity of the spots is related to the degree of order on the surface. When the surface is less ordered the diffraction beams broaden and become less intense, while some diffuse brightness appears between the beams. [Pg.24]

Figure 1.1. Schematic diagram showing the electron elastic scattering pathways contributing to the techniques of low energy electron diffraction (LEED), backscattering photoelectron diffraction (including the scanned-energy mode - PhD) and surface extended X-ray absorption fine structure (SEXAFS). Black disks represent substrate atoms, grey-shaded disks represent adsorbate atoms. Figure 1.1. Schematic diagram showing the electron elastic scattering pathways contributing to the techniques of low energy electron diffraction (LEED), backscattering photoelectron diffraction (including the scanned-energy mode - PhD) and surface extended X-ray absorption fine structure (SEXAFS). Black disks represent substrate atoms, grey-shaded disks represent adsorbate atoms.
The electron-energy-loss spectroscopy (EELS) was performed in transmission with a primary beam energy of 170 keV in a purpose-built UHV spectrometer described in detail elsewhere [5]. For the valence level excitations and elastic scattering (electron diffraction) data the momentum resolution of the instrument was set to 0.04 A 1 with an energy resolution of 90-140 meV. The core level excitations were performed with a momentum and energy resolution of 0.2 A"1 and 90-140 meV, respectively. All EELS experiments were conducted at room temperature. [Pg.205]

Fig. 6.6 The principle of low-energy electron diffraction (LEED) is that a beam of monoenergetic electrons scatters elastically from a surface. Due to the periodic order of the surface atoms, electrons show constructive interference in directions for which the path lengths of the electrons differ by an integral number times the electron wavelength. Directions of constructive interference are made visible by collecting the scattered electrons on a fluorescent screen. Fig. 6.6 The principle of low-energy electron diffraction (LEED) is that a beam of monoenergetic electrons scatters elastically from a surface. Due to the periodic order of the surface atoms, electrons show constructive interference in directions for which the path lengths of the electrons differ by an integral number times the electron wavelength. Directions of constructive interference are made visible by collecting the scattered electrons on a fluorescent screen.

See other pages where Electron diffraction, elastic is mentioned: [Pg.1625]    [Pg.21]    [Pg.348]    [Pg.145]    [Pg.146]    [Pg.508]    [Pg.158]    [Pg.159]    [Pg.160]    [Pg.8]    [Pg.344]    [Pg.4]    [Pg.523]    [Pg.3]    [Pg.4]    [Pg.191]    [Pg.416]    [Pg.16]    [Pg.169]    [Pg.249]    [Pg.7]    [Pg.342]    [Pg.548]    [Pg.59]    [Pg.150]    [Pg.267]    [Pg.462]    [Pg.162]    [Pg.145]    [Pg.695]    [Pg.128]    [Pg.5]    [Pg.53]   
See also in sourсe #XX -- [ Pg.385 ]




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