Dynamic force microscopy

GiessibI F J 1997 Forces and frequency shifts in atomic-resolution dynamic-force microscopy Phys. Rev. B 56 16 010... 

Bammerlin M, Luthi R, Meyer E, Baratoff A, Lu J, Guggisberg M, Gerber Ch, Howald L and Gutherodt H-J 1997 True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy Probe Microsc. 1 3... 

Recent progress in dynamic force microscopy/spectroscopy (SFM/SFS) as applied to polymers, and molecular layers such as OMBE-ftlms and LB-films is briefly reported here and illustrated by Figs. 1-6. 

Dynamic force spectroscopy (DFS) was introduced [1] allowing us to understand quantitatively dissipative and non-dissipative processes in dynamic force microscopy [2]. Using a combined experimental and computer simulation technique it is possible to reconstruct force/distance ciuves without using any model potentials and parameters. This method opens the perspective to extract material parameters such as atomic densities of the surface investigated as well as local elastic properties... 

The more recent development concerns the use of the oscillating behavior of the tip-cantilever (CL) system when brought close to the sample surface. Two modes can be used in dynamic force microscopy. With one mode, commonly called tapping. 

U. Durig, Interaction sensing in dynamic force microscopy, New]. Phys., 2, 5 (2000],... 

L. Nony, T. Cohen-Bouhacina, and J. R Aime, Dissipation induced by attractive interaction in dynamic force microscopy contribution of adsorbed water layers. Surf. Set, 499,152-160 [2002]. 

Troger, L. and Reichling, M. (2010) Quantification of antagonistic optomechanical forces in an interferometric detection system for dynamic force microscopy. Appl. Phys. Lett., 97, 213105. 

Gauthier, M. and Tsukada, M. (2000) Damping mechanism in dynamic force microscopy. Phys. Rev. Lett., 85, 5348-5351. 

Kobayashi, K., Yamada, H., Itoh, H., Horiuchi, T., and Matsushige, K. (2001) Analog frequency modulation detector for dynamic force microscopy. Rev. Sci. Lnstrum., 72, 4383-4387. 

Foster, A.S., Barth, C., Shluger, A.L, Nieminen, R.M., and Reichling, M. (2002) Role of tip structure and surface relaxation in atomic resolution dynamic force microscopy. CaF2(lll) as a reference surface. Phys. Rev. B, 66, 235417. 

T., and Wiesendanger, R. (2004) Atomic-resolution dynamic force microscopy and spectroscopy of a single-walled carbon nanotube characterization of interatomic van der Waals forces. Phys. Rev. Lett., 93, 136101. 

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